Microwave diode-based dynamic strain measuring device

A technology of dynamic strain and measurement device, applied in the field of strain measurement, can solve the problems of calibration, high cost, calibration, etc., and achieve the effect of solving zero drift and creep

Inactive Publication Date: 2011-03-30
TIANJIN UNIV
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  • Abstract
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Problems solved by technology

However, the fiber-type flexible strain measurement is limited by the difference in its structural arrangement and the characteristics of the signal, especially the optical fiber device requires additional devices such as light source and photoelectric conversion, and the cost is high
In addition, signal drift caused by external environmental factors will also cause problems such as calibration and calibration
[0006] The above patent applications are all realized by time-domain measurement of single-signal input and output, which cannot avoid problems such as drift caused by non-measurement signals such as environmental factors during the measurement process, and corresponding calibration must be carried out for each measurement

Method used

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  • Microwave diode-based dynamic strain measuring device
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  • Microwave diode-based dynamic strain measuring device

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Embodiment Construction

[0026] The present invention will be described in further detail below in conjunction with the accompanying drawings and embodiments.

[0027] attached figure 1 It is a structural diagram of a single crystal silicon thin film flexible microwave diode dynamic strain sensor. The substrate includes PET plastic 1 and an adhesive layer 2 to support the main part of the microwave diode dynamic strain sensor. The single crystal silicon thin film flexible microwave diode is on the PET plastic substrate 1 (other types of ordinary plastic or flexible materials can be used as the substrate substrate), and there is a layer of SU8 material layer 2 on the surface of the PET plastic as an adhesive layer. The main part of the work of the thin-film flexible microwave diode strain sensor is a thin-film PIN diode made of doped single-crystal silicon. In the figure, 3, 4, and 5 represent the P-type doped region and the undoped region of the single-crystal silicon thin film, respectively. , and ...

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Abstract

The invention belongs to the technical field of strain measurement, and relates to a microwave diode-based dynamic strain measuring device. The microwave diode-based dynamic strain measuring device comprises a flexible film microwave strain sensor, a dynamic load tester and a network analyzer, wherein the flexible film microwave strain sensor is a monocrystalline silicon microwave diode film; the dynamic load tester is used for loading an object to be tested; and the network analyzer comprises a microwave sweep frequency signal output end and a receiving input end, the output end and the input end are respectively connected with an anode or a cathode of a flexible film microwave strain gauge, data which represents the relation of the strain and a parameter S is stored in the network analyzer, and when measuring, the network analyzer realizes the measurement of dynamic flexible strain according to the data of the variation of the parameter S of the flexible film microwave strain sensor acquired by implementation. The microwave diode-based dynamic strain measuring device has higher precision and can realize self-calibration function and measure high-frequency dynamic strain.

Description

technical field [0001] The invention belongs to the technical field of strain measurement, and in particular relates to a dynamic strain measurement device. Background technique [0002] Dynamic strain measurement is generally used to study deformation monitoring with operating frequency of tens of KHz or hundreds of KHz, not only to detect the occurrence of mechanical deformation, but also to detect the change of mechanical deformation in real time. The traditional dynamic strain measurement method basically uses resistance strain gauges to form a measuring bridge, combined with the corresponding peripheral circuits, and adopts frequency modulation to form a dynamic strain measurement system. Among the disclosed patents for dynamic strain measurement, for example, patent CN201096560 discloses a dynamic stress and strain measurement device for stamping dies, including strain rosettes, resistive strain gauges, bridge boxes, dynamic strain gauges, displacement sensors, industr...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B15/06
Inventor 吕辰刚秦国轩张瑞峰邹强姬中凯马建国
Owner TIANJIN UNIV
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