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Test system and test method thereof

A test system and test method technology, applied in the direction of detecting faulty computer hardware, etc., can solve the problems of human error, labor consumption, time-consuming and so on

Active Publication Date: 2013-01-23
QUANTA COMPUTER INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, when inspectors inspect electronic devices by the above-mentioned manual inspection method, in addition to possible human error caused by manual judgment, it is also quite time-consuming and labor-intensive.

Method used

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  • Test system and test method thereof
  • Test system and test method thereof
  • Test system and test method thereof

Examples

Experimental program
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Embodiment Construction

[0034] Please refer to figure 1 , which shows a block diagram of a test system according to an embodiment of the present invention. Such as figure 1 As shown, the test system 200 includes the electronic device 150 and the test device 100 . The electronic device 150 includes a plurality of output interfaces 140 . The aforementioned electronic device is, for example, a notebook computer or other electronic devices with multiple output interfaces. The test device 100 includes a communication unit 10 , a multiplexing unit 30 , a plurality of test interfaces 50 , a conversion unit 70 and a processing unit 90 .

[0035] For example, the electronic device 150 provides corresponding test signals s1 - sn through a plurality of output interfaces 150 according to a set of operation commands. The multiple test interfaces 50 are respectively coupled to the multiple output interfaces 140 . The conversion unit 70 is used for converting a plurality of test signals received through the ...

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Abstract

The invention relates to a test system and a test method thereof. The test system comprises an electronic device and a test device, wherein the electronic device comprises a plurality of output interfaces and provides a corresponding test signal through the output interfaces according to a set of operation instructions; the test device comprises a plurality of test interfaces respectively coupledwith the output interfaces, a converting unit for converting the test signals received by the test interfaces, a multiplex unit for choosing the converted test signals, and a processing unit for controlling the multiplex unit to chose one of the converted test signals according to the operation instructions, judging if the chosen converted test signal is accorded with a preset condition so as to generate a test result message, and controlling a communication unit according to the test result message to transmit the test result message to the electronic device.

Description

technical field [0001] The invention relates to a test system and its test method, in particular to a test system and its test method which can automatically test multiple output interfaces of an electronic device. Background technique [0002] In today's era of fast-changing technology, many electronic devices used in daily life have been developed. An electronic device such as a notebook computer supports multiple output interfaces to satisfy consumers' visual enjoyment of audio and video. Multiple output interfaces, for example, respectively support Video Graphics Array (Video Graphics Array, VGA) interface standard, High Definition Multimedia Interface (High Definition Multimedia Interface, HDMI) standard, S terminal (Super-Video) standard, display port (Display Port) Standard, Sony / Philips Digital Interface (Sony / Philips Digital InterFace, S / PDIF) standard or one of Audio Line Out standard. [0003] Before the electronic device leaves the factory, the inspectors of ea...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/22
Inventor 陈俊诚
Owner QUANTA COMPUTER INC