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Method for simultaneously measuring electro-optic coefficients Pockels and Kerr

An electro-optic coefficient and coefficient technology, which is applied in the direction of photometry and material excitation analysis using electric radiation detectors, to achieve the effects of strong operability, low experimental conditions and equipment requirements, and simple measurement data.

Inactive Publication Date: 2011-04-27
SHANGHAI JIAO TONG UNIV
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Problems solved by technology

[0005] Aiming at the deficiency of measuring single electro-optic coefficient in the prior art, the present invention proposes a method for simultaneously measuring Pockels and Kerr electro-optic coefficients, using prism coupling to excite surface plasmon waves, so that the incident light energy is coupled into surface plasmon wave modes and guided wave modes, The energy of reflected light attenuates sharply to form a series of resonance curves, that is, the attenuated total reflection (ATR) curve

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  • Method for simultaneously measuring electro-optic coefficients Pockels and Kerr
  • Method for simultaneously measuring electro-optic coefficients Pockels and Kerr
  • Method for simultaneously measuring electro-optic coefficients Pockels and Kerr

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Embodiment Construction

[0022] The embodiments of the present invention are described in detail below. This embodiment is implemented on the premise of the technical solution of the present invention, and detailed implementation methods and specific operating procedures are provided, but the protection scope of the present invention is not limited to the following implementation example.

[0023] Such as Figure 1-Figure 4 As shown, the test environment of this embodiment includes: incident light 1, reflected light 2, prism 3, upper electrode 4, polymer material film layer 5, buffer layer 6, lower electrode 7, waveform generator 8, laser 9, polarizer 10. Detector 11, oscilloscope 12, sample 13, AD converter 14, computer 15, step meter 16 and rotometer 17, wherein: prism 3, upper electrode 4, polymer material film layer 5, buffer layer 6, lower The electrode 7 constitutes the sample 13 to be tested, namely figure 1 In the shown prism-waveguide structure, from the prism 3 to the bottom, there are pol...

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Abstract

The invention provides a method for simultaneously measuring electro-optic coefficients Pockels and Kerr, belonging to the technical field of electro-optic measurement. In the method, surface plasmon wave is excitated by adopting prism coupling so that the energy of the incident light is coupled into the surface plasmon wave mode and the guided wave mode and the energy of the reflected light attenuates rapidly to form a series of resonance curves, namely attenuated total reflection (ATR) curves; and a triangular wave voltage is applied to modulate the incident light, the ATR curves slightly move horizontally, the intensity of the reflected light varies, and the coefficients Pockels and Kerr are solved through the variable quantity.

Description

technical field [0001] The invention relates to a method in the technical field of photoelectric measurement, in particular to a method for simultaneously measuring Pockels and Kerr electro-optic coefficients. Background technique [0002] The integration of photonics and material science has made new photonic devices with special functions a research hotspot. Polymer photonics materials are a new class of polymer functional materials that can transmit, modulate, display and store photons. It has the following characteristics: First, the structure is diverse, and functional materials with specific structures can be prepared through reasonable molecular design and synthesis and tailoring according to needs; second, polymer materials have good compatibility, strong optical nonlinearity, and fast response time. Fast, low driving voltage, enabling electro-optic devices to obtain high modulation bandwidth; third, it has high photothermal coefficient and low thermal conductivity,...

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Application Information

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IPC IPC(8): G01J1/42G01N21/63
Inventor 石现领邓晓旭朱宵辉祝颂高景
Owner SHANGHAI JIAO TONG UNIV
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