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Temperature measurement method under high microwave radiation

A microwave radiation and temperature measurement technology, which is applied in the field of microwave temperature measurement, can solve the problem that the microwave temperature measurement technology cannot be applied to temperature measurement on a large scale, and achieves the effect of a simple method.

Inactive Publication Date: 2012-05-23
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0006] The purpose of the present invention is to solve the shortcomings of the above-mentioned existing microwave temperature measurement technology that cannot be applied on a large scale to temperature measurement under high microwave radiation, and propose a temperature measurement method under high microwave radiation

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  • Temperature measurement method under high microwave radiation
  • Temperature measurement method under high microwave radiation
  • Temperature measurement method under high microwave radiation

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Embodiment Construction

[0020] Below in conjunction with accompanying drawing, provide the specific embodiment of the present invention.

[0021] The structure diagram of the present invention is as figure 1 As shown, a circular hole 2 of a certain size is opened on the wall 1 of the microwave device. The hole 2 is connected with the cut-off waveguide 3, and the microwave leaking from the hole is prevented through the cut-off waveguide 3. The convex lens 4 is placed in the cut-off waveguide 3. The convex lens 4. Converge the infrared light transmitted from the hole 2 and the cut-off waveguide 3, place the thermistor infrared detector 5 at the converging place, and obtain the temperature of the measured object 6 by amplifying and converting the detected infrared light signal. In order to prevent the steam in the measured object 6 from entering the cut-off waveguide 3, a high-transparency glass 7 can be added in front of the hole 2.

[0022] A temperature measurement method under high microwave radiat...

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Abstract

The invention discloses a temperature measurement method under high microwave radiation. Aiming at the defect that the conventional microwave temperature measurement technology cannot be applied to temperature measurement on a large scale under high microwave radiation, the method comprises the following steps of: forming a circular hole on a wall of a microwave device, and blocking microwaves leaking from the hole by using a cutoff waveguide; converging infrared light transmitted through the cutoff waveguide by using a convex lens; and detecting by using an infrared detector so as to obtain the temperature of an object to be measured. The method is simple and practical, and the temperature of the object inside the microwave device can be effectively measured in real time.

Description

technical field [0001] The invention belongs to the technical field of microwave temperature measurement, in particular to a temperature measurement method under high microwave radiation. Background technique [0002] Microwave heating has the characteristics of high efficiency, controllability, no open flame, no smoke, safety, etc., and has a wide range of applications in industrial or household cooking. However, in the process of microwave heating, due to the strong radiation of microwaves, it has a heating effect on metals and polarized non-metallic materials. Because microwave heating is generally in a closed cavity, thermometers based on infrared radiation are not suitable, so The method of measuring temperature based on conventional temperature sensors is no longer applicable. There are three main types of microwave temperature measurement technology widely used: [0003] 1. In the microwave hyperthermia machine, measure the temperature with a thermocouple. Because ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01J5/10G01J5/06
Inventor 喻志远郭龙
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA