Electric contact member and contact probe

A technology of electrical contacts and components, which is applied to contact parts, parts of connecting devices, parts of electrical measuring instruments, etc., can solve the problems of high price of contact probes, achieve economical durability, excellent durability, and reduce usage Effect

Inactive Publication Date: 2011-06-29
NHK SPRING CO LTD
View PDF4 Cites 4 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, in this case, since a large amount of expensive precious metals are used, there is a problem that the contact probe becomes expensive

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Electric contact member and contact probe
  • Electric contact member and contact probe
  • Electric contact member and contact probe

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0018] Hereinafter, modes for implementing the present invention (hereinafter referred to as "embodiments") will be described with reference to the drawings. In addition, the drawings are schematic diagrams, and it should be noted that the relationship between the thickness and width of each part, the ratio of the thickness of each part, etc. may be different from reality, and of course there are also mutual dimensions between the drawings. The relationship or ratio of different parts of the situation.

[0019] figure 1 It is a figure which shows the structure of the touch probe which concerns on one Embodiment of this invention. The touch probe 1 shown in this figure includes: a first plunger 2 and a second plunger 3 having front ends protruding in opposite directions; ( figure 1 The up and down direction) the spring member 4 that stretches freely.

[0020] The contact probe 1 is accommodated in the probe holder 5, and electrically connects a semiconductor integrated circ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

Provided are an electric contact member which has excellent durability and high cost performance, and a contact probe. The electric contact member is provided with an outer circumferential section, which is symmetrical with respect to the center axis in the longitudinal direction and has a hollow section, and a core section, which extends in a substantially bar-like shape in the longitudinal direction and fills the hollow section. One of the outer circumferential section and a part of the core section is composed of a noble metal alloy, and the other one is composed of a conductive material different from the noble metal alloy. One of the outer circumferential section and the core section, which is composed of the noble metal alloy, may protrude from the other at one end in the longitudinal direction.

Description

technical field [0001] The invention relates to an electric contact part and a contact probe formed by using the electric contact part. Background technique [0002] Conventionally, there is known a technique of using a conductive contact probe to transmit inspection signals to a semiconductor integrated circuit when performing electrical characteristic inspection of a semiconductor integrated circuit such as an IC chip (see, for example, Patent Document 1). In this technique, the portion that contacts the electrode of the semiconductor integrated circuit or the circuit board that transmits the inspection signal is constituted by a needle-shaped electrical contact member. In order to improve the conductivity of such a contact probe, a method of plating a precious metal such as gold or silver on the surface of an electrical contact member is often used. [0003] However, with the contact probe, as the number of inspections increases, the solder flux of the electrodes of the ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G01R1/073G01R1/067H01H1/04H01L21/66H01R13/03H01R13/24
CPCH01R13/03G01R1/07314H01R13/2421H01H1/023G01R1/06722Y10T29/49204G01R1/067H01H1/04H01L22/00
Inventor 风间俊男高村典利瓦林朋弘
Owner NHK SPRING CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap