Preparation method of multicrystalline silicon texture
A technology of polysilicon and polysilicon wafers, applied in chemical instruments and methods, crystal growth, gaseous chemical plating, etc., can solve problems such as low photoelectric conversion efficiency, small short-circuit current, and poor light trapping effect, and achieve improved short-circuit current Isc, The effect of large structure size and reduced reflectivity
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Embodiment 1
[0013] Embodiment 1, a kind of preparation method of polysilicon textured surface, it comprises the following steps:
[0014] 1. Use the PECVD equipment with double deposition chambers to coat the polysilicon raw material with double-layer protective film on one side.
[0015] (1) In the first deposition chamber of the PECVD equipment, the inflatable gas flow ratio is nitrous oxide N of 1.2:1 2 O and silane gas SiH 4 , the deposition temperature is 350 ° C, and a layer of porous silicon dioxide SiO is deposited on the raw material sheet 2 layer, the silicon dioxide layer was deposited with a thickness of 5 nm.
[0016] (2) In the second deposition chamber of the PECVD equipment, the gas flow ratio of the filling gas is 3: 1 ammonia gas NH 3 and silane gas SiH 4 , the deposition temperature is 500°C, and a layer of porous silicon nitride Si is deposited on one side of the polysilicon wafer deposited with a silicon dioxide layer. 3 N 4 layer, the silicon nitride layer was ...
Embodiment 2
[0020] Embodiment 2, a kind of preparation method of polysilicon textured surface, it comprises the following steps:
[0021] 1. Use the PECVD equipment with double deposition chambers to coat the polysilicon raw material with double-layer protective film on one side.
[0022] (1) In the first deposition chamber of the PECVD equipment, the inflatable gas flow ratio is nitrous oxide N of 1.6:1 2 O and silane gas SiH 4 , the deposition temperature is 400 ° C, and a layer of porous silicon dioxide SiO is deposited on the raw material sheet 2 layer, the silicon dioxide layer was deposited with a thickness of 9 nm.
[0023] (2) In the second deposition chamber of the PECVD equipment, the gas flow ratio is 3.5:1 ammonia NH 3 and silane gas SiH 4 , the deposition temperature is 550°C, and a layer of porous silicon nitride Si is deposited on one side of the polysilicon wafer deposited with the silicon dioxide layer. 3 N 4 layer, the silicon nitride layer was deposited with a thi...
Embodiment 3
[0027] Embodiment 3, a kind of preparation method of polysilicon textured surface, it comprises the following steps:
[0028] 1. Use the PECVD equipment with double deposition chambers to coat the polysilicon raw material with double-layer protective film on one side.
[0029] (1) Dinitrogen monoxide N with gas flow ratio of 1.4:1 in the first deposition chamber of PECVD equipment 2 O and silane gas SiH 4 , the deposition temperature is 450 ° C, and a layer of porous silicon dioxide SiO is deposited on the raw material sheet 2 layer, the silicon dioxide layer was deposited to a thickness of 10 nm.
[0030] (2) Ammonia NH with gas flow ratio of 5:1 in the second deposition chamber of PECVD equipment 3 and silane gas SiH 4 , the deposition temperature is 600°C, and a layer of porous silicon nitride Si is deposited on one side of the polysilicon wafer deposited with the silicon dioxide layer. 3 N 4 layer, the silicon nitride layer was deposited with a thickness of 25 nm.
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