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Four-probe piezoresistor tester and grading test method thereof

A test method and varistor technology, which are used in electrical measuring instrument parts, single semiconductor device testing, and resistance/reactance/impedance measurement, etc., can solve problems such as easy failure and increased production costs, and achieve improved efficiency and reduced Manual, reduce the effect of the alignment process

Inactive Publication Date: 2013-05-29
ZIBO SENSCON
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In varistor manufacturing enterprises, varistor testers are used to automatically grade the varistors produced, which involves a test method. The traditional test method uses three-pole three-pin test, that is, Use three probes to test the three electrodes of the piezoresistor, which requires a detection and alignment device so that the three electrodes of the piezoresistor are just aligned with the three probes. In order to achieve alignment, a photoelectric detection and rotation device must be added , the photoelectric detection is used to detect whether the probe is aligned with the electrode, and the rotating device is used to rotate the piezoresistor chip so that the probe can be aligned with the electrode, so that there is an additional alignment process, which increases the production cost and is prone to failure

Method used

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  • Four-probe piezoresistor tester and grading test method thereof
  • Four-probe piezoresistor tester and grading test method thereof
  • Four-probe piezoresistor tester and grading test method thereof

Examples

Experimental program
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Effect test

Embodiment 1

[0029] Such as figure 1 As shown, a four-probe test head 2 is provided, the end of the four-probe test head 2 is connected to the input end of the processing device 3 , and the output end of the processing device 3 is connected to the display 4 . The tops of the four probes 1 of the four-probe test head 2 are on the same plane. The four probes 1 of the four-probe test head 2 are evenly distributed in the same circle, and the connecting lines between two adjacent probes 1 and the center of the circle form an angle of 90° to each other.

[0030] The four-probe test head inputs the detection data into the processing device for calculation, judgment and processing, and displays the data through the display to classify the piezoresistors.

[0031] Such as figure 2 As shown, when the four-probe test head touches the electrodes of the piezoresistor to be tested, these two situations will occur: in one case, one probe 1 falls on the insulator 6 between the electrodes 5, and the oth...

Embodiment 2

[0040] The rest of the steps remain unchanged. When determining effective probes, calculate the voltage difference between two probes to obtain the voltage ratio between any three probes, that is, compare the four groups of voltage ratios, and make the voltage ratio the smallest A group of corresponding three probes are regarded as valid probes, and the remaining one is regarded as invalid probes.

[0041] That is to calculate the high voltage, low voltage, extreme difference and polarity difference and voltage ratio between the first group of data probe A-probe C-probe B respectively, and the second group of data probe A-probe C-probe The high voltage, low voltage, range and polarity difference and voltage ratio between D, the third set of data probe B-probe D-probe A high voltage, low voltage, range and polarity difference and voltage Ratio, the fourth set of data probe B-probe D-probe C high voltage, low voltage, extreme difference and polarity difference and voltage ratio....

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Abstract

The invention relates to a four-probe piezoresistor tester and a grading test method thereof, and belongs to the technical field of piezoresistor detection. The four-probe piezoresistor tester comprises a processing device and a display, and is characterized in that: a four-probe test head is provided; the tail end of the four-probe test head is connected with the input end of the processing device; and the output end of the processing device is connected with the display. The grading test method is characterized by comprising the following steps of: 1) contacting the four-probe test head andan electrode of a piezoresistor to be tested; 2) acquiring probe information; 3) determining the effectiveness of the probe information; 4) processing effective information; and 5) displaying a result. By adoption of the four-probe test head and a four-probe three-electrode test method thereof, an aligning working procedure during test can be avoided, the efficiency is improved, and the labor andthe cost are reduced; moreover, as the aligning working procedure is avoided, the shortcoming in manual operation is avoided and the test is more reliable.

Description

technical field [0001] The invention provides a four-pin varistor tester and a classification test method thereof, belonging to the technical field of varistor detection. Background technique [0002] The three electrodes of the varistor are evenly distributed on the circumference. In varistor manufacturing enterprises, varistor testers are used to automatically grade the varistors produced, which involves a test method. The traditional test method uses three-pole three-pin test, that is, Use three probes to test the three electrodes of the piezoresistor, which requires a detection and alignment device so that the three electrodes of the piezoresistor are just aligned with the three probes. In order to achieve alignment, a photoelectric detection and rotation device must be added , the photoelectric detection is used to detect whether the probe is aligned with the electrode, and the rotating device is used to rotate the piezoresistor chip so that the probe can be aligned wi...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/26G01R1/073G01R27/02
Inventor 姜志鸿相秀朋
Owner ZIBO SENSCON
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