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Method for measuring and calculating interface resistivity of Pb-Sn-Al laminated composite material

A pb-sn-al, layered composite technology, applied in the direction of measuring resistance/reactance/impedance, measuring electrical variables, measuring devices, etc. Simple and easy to operate effect

Inactive Publication Date: 2013-05-15
KUNMING UNIV OF SCI & TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, this qualitative analysis does not play a real guiding role or testing significance for revealing the influence law between the conductivity of the interface and the process parameters (such as temperature, pressure, time, composition, etc.) of the prepared material.

Method used

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  • Method for measuring and calculating interface resistivity of Pb-Sn-Al laminated composite material
  • Method for measuring and calculating interface resistivity of Pb-Sn-Al laminated composite material
  • Method for measuring and calculating interface resistivity of Pb-Sn-Al laminated composite material

Examples

Experimental program
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Effect test

Embodiment 1

[0017] Example 1: like figure 1 As shown, it is assumed that there is a Pb-Al layered composite bulk material reference body that has no contact resistance at the interface and has the same shape and cross-sectional area s as the Pb-Sn-Al layered composite bulk material. The body and the tested body meet the conditions , and .

[0018] According to the method and principle of testing block resistance by the four-terminal connection method, the measured Pb-Sn-Al layered composite block materials (such as image 3 Shown) the resistance of the Al and Pb matrix bulk materials, the resistivity is calculated by measuring and averaging 10 times 2.81×10 -8 Ω·m (theoretical value is 2.65×10 -8 Ω·m) and 2.11×10 -7 Ω·m (theoretical value is 2.1×10 -7 Ω·m).

[0019] Using scanning electron microscope microscale calibration technology, the cross-sectional area s of Pb-Sn-Al layered composite material is directly measured as 10mm×10mm=100mm 2 , the width of the Al matrix 1...

Embodiment 2

[0021] Example 2: like image 3 As shown, it is assumed that there is a Pb-Al layered composite bulk material reference body that has no contact resistance at the interface and has the same shape and cross-sectional area s as the Pb-Sn-Al layered composite bulk material. The body and the tested body meet the conditions , and .

[0022] According to the method and principle of the four-terminal wiring method to test the bulk resistance, use the KEITHLY-2000 desktop multimeter to measure the difference in the preparation process. image 3 Another measured Pb-Sn-Al layered composite bulk material, the resistance of the Al, Pb matrix bulk material, through the method of 6 measurements and averaging, calculate the resistivity 2.73×10 -8 Ω·m (theoretical value is 2.65×10 -8 Ω·m) and 2.14×10 -7 Ω·m (theoretical value is 2.1×10 -7 Ω·m).

[0023] Using scanning electron microscope microscale calibration technology, the cross-sectional area s of Pb-Sn-Al layered composite...

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Abstract

The invention relates to a method for measuring and calculating the interface resistance of a Pb-Sn-Al layered composite material, which belongs to the technical field of measuring and calculating the interface resistivity of layered block materials. Assuming that there is a Pb-Al material reference body with no contact resistance at the interface and the same shape and cross-sectional area as the material to be tested, the total resistance of the measured body and the Al, Pb Substrate material resistance RAl and RPb, through scanning electron microscope micro-scale calibration technology, measure the Pb matrix width l'Pb, Al matrix width lAl, single-side interface width l interface and cross-sectional area s of the measured object, and calculate the measured The resistivity of the Al and Pb matrix of the Pb-Sn-Al layered composite block material is obtained through the formula to obtain the reference bulk resistance, and then the interface resistivity is calculated according to the formula. It has the advantages of convenient operation, simple and easy calculation method, and the interface width of the measured layered composite bulk material can reach below the micron level.

Description

technical field [0001] The invention relates to a method for measuring and calculating the interface resistance of Pb-Sn-Al metal layered composite materials, combined with the four-point collinear probe method to measure the resistance of block materials and scanning electron microscope microscale calibration technology, obtained by indirect measurement and calculation method The invention relates to the resistivity of the Sn interface with a micron-order width, belonging to the technical field of measuring and calculating the interface resistivity of metal layered bulk materials. Background technique [0002] At present, for the accurate measurement of the resistance of bulk materials with very small resistance, there are low-voltage and low-resistance measuring instruments such as KEITHLEY and other brands with high precision, which use the four-point collinear probe method (also known as the four-terminal connection method). The principle is to measure bulk resistance, a...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R27/02
Inventor 周生刚竺培显孙勇段永华
Owner KUNMING UNIV OF SCI & TECH