High frequency cantilever type probe clamp
A technology of probe cards and probes, which is applied in the direction of instruments, measuring devices, measuring electricity, etc.
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[0044] In order to explain the present invention more clearly, a detailed description of preferred embodiments and illustrations are given below. among them, Figure 4 to Figure 6 Shown is a high-frequency cantilever probe card 100 according to a preferred embodiment of the present invention. Figure 5 for Figure 4 Sectional view of the 5-5 direction. and Image 6 It is a schematic diagram of the arrangement of signal pins and ground pins of a probe card. The probe card 100 can be used for electrical testing of signal connection structures of objects under test such as semiconductor dies, integrated circuits or other electronic circuit signal bearing substrates. It includes a The circuit board 30, a pin base 40, a plurality of signal pins 50, at least one ground pin 60 and a plurality of metal wires 70, wherein:
[0045] The circuit board 30 is a disc-shaped printed circuit board, which has an upper surface 30a and a lower surface 30b. The upper surface 30a is for electrical co...
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