Low-temperature scanning near field optical microscope

Abstract

The invention discloses a low-temperature scanning near field optical microscope, which belongs to the manufacturing field of near field optical equipment. The microscope is provided with a vacuum chamber, wherein the vacuum chamber is divided into an upper part and a lower part, the upper part is a scanning chamber, the lower part is a low-temperature Dewar chamber, a scanning head is arranged in the scanning chamber, optical paths of the scanning head include an illumination optical fiber, a pinpoint optical fiber and a scanning control electronic circuit, the illumination optical fiber is connected with a laser outside the vacuum chamber, the pinpoint optical fiber is connected with an external spectrograph and a photomultiplier, the spectrograph and the photomultiplier are connected with a scanning controller, and the scanning control electronic circuit is connected with the scanning controller. According to the invention, an efficient low-temperature scanning near field optical microscope is manufactured.

Description

technical field [0001] The invention belongs to the field of near-field optical instrument manufacturing, and in particular relates to the overall design of a low-temperature scanning near-field optical microscope system. Background technique [0002] Near-field optical microscopy (SNOM) exploits near-field interactions and can achieve a resolution of less than 100 nm, far superior to far-field microscopy limited by diffraction barriers. The idea of ​​using near-field optics for imaging was first proposed by Synge in 1928, who showed that the combination of illuminating an object through a subwavelength aperture and a detector very close to the sample allowed high resolution to be obtained through a non-diffraction-limited process. The conventional experimental instrument that turned the principle into reality was completed by Pohl et al. in 1984, so that the scanning near-field optical microscope was realized, and the optical diffraction limit was truly broken. Scanning ne...

AI Technical Summary

Problems solved by technology

The low-temperature SNOM needs to be scanned in a vacuum chamber, and the cooling of the sample must be considered, so the design of the traditional SNOM cannot be applied in the working environment of the low-temperature SNOM

Although other scanning probe microscopes, such as scanning tunneling microscopes, have some designs that work in a low-temperature vacuum environment, they are difficult to apply to low-temperature SNOMs because they do not involve the construction of optical paths.

The low-temperature SNOM developed by a few research groups in the world is complex in design, difficult to process, and difficult to maintain. At present, there is no mature low-temperature SNOM system design scheme.

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