Patents
Literature
Patsnap Copilot is an intelligent assistant for R&D personnel, combined with Patent DNA, to facilitate innovative research.
Patsnap Copilot

174results about How to "Simple light path" patented technology

Variable-cycle multi-beam interference photoetching method

The invention relates to a variable-cycle multi-beam interference photoetching method which comprises the following steps that a laser output by a laser device is reshaped, and is split into symmetrically distributed divergent beams by a beam splitting element; after passing through a collimating lens, a plurality of divergent beams are collimated into a plurality of parallel beams parallel to an optical axis; the interval between parallel beam and the optical axis is regulated through a continuous booming and expanding lens; a focusing lens focuses each beam, and a multi-beam interference pattern is formed on a focal plane; sample sheets which are coated with photo resists are arranged on the focal plane of the focusing lens so as to achieve multi-beam interference photoetching; the continuous booming and expanding lens is regulated to change the distance from each beam to the optical axis, so that the incident angle of each beam in interference is changed, and the variable-cycle multi-beam interference photoetching is obtained; and an interference exposure field is subjected to step scanning and splicing at the x-y direction through a sheet bearing platform so as to obtain the large-scale exposure. The variable-cycle multi-beam interference photoetching method provided by the invention has the advantages of easiness in regulating of a pattern cycle, capability of achieving large-area multi-beam interference photoetching and the like, and is used for the research fields of panel display, biosensing, solar batteries and self-cleaning structures.
Owner:INST OF OPTICS & ELECTRONICS - CHINESE ACAD OF SCI

Method and device for measuring thickness and refractive index of thin film

The invention discloses a method and device for measuring thickness and refractive index of a thin film and an application thereof. The method comprises the following steps of: projecting at least three light beams onto the same point or position on the surface of a thin film sample in different incident angles, receiving intensity of a reflected light beam by an array photoelectric detector, comparing the intensity with the light intensity of an incident light beam, calculating the refractive index of each light beam, and finally fitting with a theoretical formula to obtain the thickness and the refractive index of the thin film to be measured. The device comprises a power supply, a transmission grating, a diaphragm, a condenser lens, a polarizer and a sample rotating platform are sequentially arranged along optical axis; axis of the sample rotating platform is coincided with the axis of a photoelectric detector rotating platform, wherein the diameter of the photoelectric detector rotating platform is more than the diameter of the sample rotating platform; and a photoelectric detector, a signal sampling, amplifying and AD conversion circuit and a computer which are arranged on the photoelectric detector rotating platform are sequentially connected. The method and device disclosed by the invention have the characteristics of fast measuring speed and high spatial resolution, and integrated circuits (IC) and / or functional thin-film devices can be detected in a large scale.
Owner:SOUTH CHINA NORMAL UNIVERSITY

Miniaturization lens-free laser three-dimensional imaging system based on micro-electromechanical system (MEMS) scanning micro-mirror and imaging method thereof

The invention discloses a miniaturization lens-free laser three-dimensional imaging system based on a micro-electromechanical system (MEMS) scanning micro-mirror and an imaging method thereof. The miniaturization lens-free laser three-dimensional imaging system adopts a red,green and blue three-color laser as a lighting source, three-color laser output luminous power combines into a bunch of white light to be projected on the surface of an object after modulation, red light components, green light components and blue light components in scattering light on the surface of the object are received by a photoelectric receiver group, and a distance value of a single detected pixel and a range value of three-color light components are obtained by a measuring circuit. A microcontroller calculates three-color luminous value of the single detected pixel according to the range value of the three-color light components, and a three-color real luminous value of the pixel is obtained by using a real-time distance square correction method. The microcontroller controls the MEMS micro-mirror to scan, distance values and three-color real luminous values of all pixels are obtained, a depth image and a gray level image of the object is generated by combination, and a three-dimensional colored image of the object is finally obtained. The miniaturization lens-free laser three-dimensional imaging system needs no optical lens, and is high in imaging resolution ratio, fast in speed, simple in structure and easy to miniaturize.
Owner:HEFEI INSTITUTES OF PHYSICAL SCIENCE - CHINESE ACAD OF SCI

Method and device for measuring speed and frequency of ultrasonic traveling wave in liquid

The invention discloses a method and a device for measuring the speed and frequency of ultrasonic traveling wave in a liquid. The method comprises the following steps that a monochromatic parallel light beam is vertical to an ultrasonic transmission direction and radiates a dynamic ultrasonic grating that the ultrasonic wave forms in the liquid; the dynamic ultrasonic grating penetrates through a lens and the diffraction spectrum of a traveling wave ultrasonic phase grating is formed; the spectrum is processed and imaged through an amplitude filter and an imaging lens, and a spectrum image of the ultrasonic traveling wave grating is obtained; the spacing of two adjacent spectral lines on the spectrum image is measured, and the wavelength of the ultrasonic wave in the liquid is calculated; the change of an electrical signal after the previous level of spectrum and zero level spectrum of the spectrum image are mixed is detected or recorded, and the frequency of the ultrasonic wave is worked out; the speed of the ultrasonic wave in the liquid is worked out through the wavelength and the frequency. The device for realizing the method comprises a light source, a transparent sink, a lens I, the amplitude filter, the imaging lens and the measuring device which are sequentially connected, and a sound-absorbing medium and the ultrasonic transducer are arranged in the transparent sink and are respectively arranged on both sides.
Owner:SOUTH CHINA NORMAL UNIVERSITY

Measuring method and device for coefficients of thermal expansion

The invention discloses a measuring method and a measuring device for coefficients of thermal expansion. The measuring method comprises the following steps of: plating a layer of membrane which transmits light partially and reflects the light partially on upper and lower surfaces of a light transmission material to be measured respectively; heating the light transmission material; allowing a beamof monochromatic light to be incident to the light transmission material to be measured in the heating process, and reflecting the monochromatic light on the upper and lower surfaces of the light transmission material respectively, so that two beams of reflected light are interfered with each other; detecting the power of the interfered reflected light, finding a temperature value corresponding to the maximum value of the power of the reflected light, and determining the change period of the power of the reflected light in preset temperature intervals of the light transmission material; and calculating according to the change period to obtain the coefficients of thermal expansion of the light transmission material to be measured in the temperature intervals. By the measured method, the coefficients of thermal expansion of the light transmission material can be measured accurately, the test accuracy is relatively high, and system error caused by thermal expansion of sample frames and the like can be eliminated effectively; and due to the adoption of a single light source, a light path is simple, the cost is low, and the thermal expansion condition of each temperature interval can be reflected visually.
Owner:WUHAN SCHWAB INSTR TECH

X-ray energy spectrum measurement method based on flat crystal diffraction imaging

The invention relates to an X-ray energy spectrum measurement method based on flat crystal diffraction imaging. By using the method, disadvantages that energy spectrum resolution is poor and measurement efficiency is low in an existing method are overcome. The method is suitable for multi-energy X-ray continuous energy spectrum measurement below 100keV. The method comprises the following steps of 1, estimating an energy spectrum scope of an X ray to be measured and determining a diffraction crystal parameter and a measurement system parameter; 2, carrying out imaging on all the diffraction angles in a diffraction angle scope and recording a diffraction image and a transmission image; 3, for a crystal determined in the step1, using a direct current X-ray source and an energy distinguishing detector to measure a rocking curve of each energy X ray to a diffraction crystal in the energy spectrum scope to be measured and calculating an integral diffraction coefficient; 4, according to the transmission image in the step2, calculating diffraction energy corresponding to each pixel of the diffraction image in the step2 so as to acquire an X-ray diffraction energy spectrum; and combining the integral diffraction coefficient of each energy to be measured in the step3 to calculate an incident X ray energy spectrum.
Owner:NORTHWEST INST OF NUCLEAR TECH

Calibration system and calibration method for optical beam orientation

The invention discloses a calibration system for optical beam orientation. The calibration system comprises a first optical lens, a second optical lens, a third optical lens, a fourth optical lens, an optical wedge and two optical receiving devices; an optical beam is reflected by the first optical lens and the second optical lens in sequence and passes above or below the fourth optical lens, after the optical beam is reflected by the third optical lens and the fourth optical lens, the optical beam passes above or below the third optical lens and then shines to the optical wedge, and two reflecting surfaces of the optical wedge incline to the direction of incident light beams; the optical receiving devices are used for receiving the optical beam reflected by the two reflecting surfaces of the optical wedge, and the second optical lens and the fourth optical lens are adjustable optical lenses. The invention further discloses a calibration method of the calibration system. The calibration system and the calibration method have automatic real-time calibration functions for the optical beam orientation, and the functions can serve as front-end systems for all kinds of laser precise application systems. The calibration system can record the state of a normal work optical path, and the quick and precise optical path recovery can be achieved.
Owner:GUANGZHOU UNIVERSITY

Anti-polarization-aliasing Michelson heterodyne laser vibration measuring instrument based on single acousto-optic modulation and non-polarization beamsplitting

The invention provides an anti-polarization-aliasing Michelson heterodyne laser vibration measuring instrument based on single acousto-optic modulation and non-polarization beamsplitting, and belongs to the field of laser interferometry. A non-polarization beamsplitter NBS is used to split beams to form a reference arm and a measuring arm. Through an acoustic optical modulator, diffraction occurs to the incident beam on the reference arm, frequency-shift first-order diffraction light is adjusted through a light beam reflex component, so propagation direction of the light beam is parallel to the direction of the incident beam. Through adjusting a reference cube-corner prism, reflected light is above the acoustic optical modulator, so that the reference light just passes through the acoustic optical modulator for one time. A measuring cube-corner prism is adjusted, so that when the reference light and the measuring light pass through the non-polarization beamsplitter NBS again, light beams are overlapped, and interference occurs. The instrument uses relatively few optical elements to realize heterodyne laser interference measurement, optical path adjustment is simple, and the instrument effectively solves problems in existing technical schemes of polarization leakage and polarization aliasing, and complex optical path adjustment. The instrument has substantial technical advantages in the field of ultra-precision vibration measurement.
Owner:HARBIN INST OF TECH

Wavefront correction method and device based on transmission-type liquid crystal space light modulator

The invention provides a wavefront correction method and device based on a transmission-type liquid crystal space light modulator, and solves the problem of wavefront correction difficulty of optical elements such as large-caliber telescopes and the like in the prior art. A ZYGO interferometer, a polaroid, the transmission-type liquid crystal space light modulator and a reflecting mirror are in coaxial and sequential arrangement, wherein the ZYGO interferometer is connected with a controller and a data display unit respectively; the ZYGO interferometer, a lens and the reflecting mirror are in coaxial and sequential arrangement; the ZYGO interferometer is connected with the controller and the data display unit respectively; an aperture diaphragm, a light filter, the polaroid, the transmission-type liquid crystal space light modulator, the lens and a CMOS (complementary metal-oxide-semiconductor transistor) sensor are in coaxial and sequential arrangement; the CMOS sensor is connected with a PC (personnel computer) and is used for receiving picture information; the transmission-type liquid crystal space light modulator is connected with a driving circuit, and is used for supplying electricity and transmitting information; the driving circuit is connected with the PC, and is used for displaying a measured phase and grayscale relationship graph of the transmission-type liquid crystal space light modulator onto the transmission-type liquid crystal space light modulator.
Owner:CHANGCHUN UNIV OF SCI & TECH

Endoscope fiber Raman probe and detection device

The invention discloses an endoscope fiber Raman probe and a detection device. The endoscope fiber Raman probe comprises a lens, a circular ring lens, a filtering layer, a circular ring filtering layer, a center optical fiber bundle, a Raman collection optical fiber, an optical fiber cable, a connecting piece, a center optical fiber bundle branch and a Raman collection optical fiber branch; the Raman collection optical fiber annually surrounds the center optical fiber bundle; the lens and the filtering layer are arranged at the front end of the center optical fiber bundle; the circular ring lens and the circular ring filtering layer are arranged at the front end of the Raman collection optical fiber; the combined optical fiber bundle of the Raman collection optical fiber and the center optical fiber bundle extends through the optical fiber cable; the other end of the optical fiber cable is divided into a Raman collection optical fiber bundle and an excitation/endoscope optical fiber bundle by the connecting piece. According to the endoscope fiber Raman probe disclosed by the invention, integrated design of optical fiber Raman and optical fiber endoscope is realized; the device hasthe advantages of small volume, low price, high flexibility and accurate detection, and is more applicable to biological in-vivo and in-situ Raman detection, and is relatively easy and convenient to maintain.
Owner:NANJING UNIV OF AERONAUTICS & ASTRONAUTICS

Focusing controllable super-resolution microscopic device based on spherical micro nano liquid drop lens

The invention discloses a focus-controllable super-resolution microscopic device based on a spherical micro-nano droplet lens, comprising: a laser, a mirror, a first lens group, a dichromatic mirror, a linear polarizer, a microscopic objective lens, a packaging box, Spherical micro-nano droplet lens, micro-flow tube, micro-displacement stage, sample stage, second lens group, imaging device, computer control system. The computer control system controls the microfluidic tube to release or absorb a certain volume of liquid droplets in the packaging box, and then regulates the radius of the spherical micro-nano liquid droplet lens to realize zooming of the spherical micro-nano liquid droplet lens. Aiming at the disadvantages of the uncontrollable focusing characteristics of the existing micro-nano structure, the present invention proposes a focus-controllable super-resolution microscopic device based on a spherical micro-nano droplet lens, which uses the spherical micro-nano droplet lens to generate photon nanojet , by adjusting the focusing characteristics of the spherical micro-nano droplet lens, the scanning of the sample at different depths can be realized without mechanical structure vibration; and it can be combined with the micro-stage to control the sample stage to realize the horizontal scanning, and complete the three-dimensional ultra-scanning of the sample. Resolution microscopy imaging.
Owner:CHINA JILIANG UNIV

Material performance testing device and material performance testing system

InactiveCN107271294ATo achieve the purpose of supplementary lightGet Full Field DeformationMaterial heat developmentScattering properties measurementsMulti fieldFull field
The invention relates to the technical field of measuring equipment for mechanical properties of materials under force, heat, electromagnetic and other multi-field coupling effect, and in particular relates to a material performance testing device and a material performance testing system. The material performance testing device comprises a heat treatment chamber, a microwave source, a microwave source control module, a holding device for a to-be-tested material, a mechanical loading device, a light source for light supplement, an infrared thermal imager for collection of the surface temperature field of the to-be-tested material and a camera for collection of the speckle image of the to-be-tested material. The material performance testing system includes the material performance testing device, a computer and a mechanical sensor which is arranged on the mechanical loading device; the computer is respectively electrically connected with the mechanical sensor, the infrared thermal imager and the camera. The temperature field and the speckle image of the to-be-tested material under the force, heat, electromagnetic and other multi-field coupling effect can be detected by the material performance testing device and the material performance testing system, further the thermal properties, full field deformation and destruction process of the to-be-tested material can be obtained, and the material performance testing device and the material performance testing system are highly intelligent.
Owner:TAIYUAN UNIV OF TECH

A Semiconductor Laser

The present invention belongs to the field of laser technology, particularly relates to a semiconductor laser, including a substrate, and lasers, fast axis collimation components, slow axis collimation components, steering compression optical systems, a polarization beam combination prism, a focusing lens and an optical fiber provided on the substrate, wherein the lasers can be arranged in two rows or one row. And lasers of the same row are all located in a same plane. Each laser is sequentially provided with a fast axis collimation component and a slow axis collimation component in the direction of an optical path. The lasers of the same row correspond to a group of steering compression optical systems used to steer and compress the light beams collimated by the fast axis collimation components and the slow axis collimation components. The polarization beam combination prism is used for combining two beams of lasers having been steered and compressed by two groups of the steering compression optical systems. And the laser combined by the polarization beam combination prism is coupled into the optical fiber by the focusing lens. The present invention has a compact structure and a simple optical path, effectively reduces the thickness of the substrate and improves the thermal dissipation capacity of the laser, so that the efficiency and reliability of the laser are improved.
Owner:BWT BEIJING

Method and device for detecting F atomic concentration

The invention relates to a detection method and a detection device for the F atom concentration, wherein, a titration HP absorption spectroscopy is adopted for measuring the F atom concentration; a route selection electric excited continuous wave HP laser is adopted to be a probe light source; the absorption spectrum intensity of HF molecules in a flow field is measured through an infrared window. Because the concentration of F atoms which are dissociated by a system to be detected is certain, when the flow rate of infused hydrogen is increased gradually, the concentration of HF molecules generated can be increased along with the increase of the flow rate until all the F atoms are reacted completely, and the absorption spectrum intensity A of the HF molecules can also be increased gradually to a stable vale; when A is just a maximum value, the corresponding hydrogen flow rate is equal to the F atom concentration. Moreover, the F atom concentration can be directly calculated through the absorption spectrum intensity of the HF molecules after related parameters are obtained by fitting of data which is obtained by titration processes for many times. The invention is a detection method and a detection device for the F atom concentration with simple and convenient operation, simple and compact structure, low cost, high measuring precision and good stability.
Owner:NAT UNIV OF DEFENSE TECH

Novel wavemeter on the basis of magnetic rotation effect

The present invention provides a novel wavemeter on the basis of magnetic rotation effect mainly for measuring wavelength of pulse laser or continuous laser. The novel wavemeter is characterized in that the novel wavemeter is composed of a laser device to be detected, a collimator, a polarizer, a magneto-optical crystal, a permanent magnet, a polarization beam splitter, a temperature-control system, a balance photoelectric detector and a collecting and analyzing system. The laser to be detected enters into the polarizer, the magneto-optical crystal and the polarization beam splitter through the collimator orderly, and deflects with an angle corresponding to the wavelength in the polarization state of the laser to be detected of the magneto-optical crystal according to the magnetic rotation effect. Two laser beams emitted by the polarization beam splitter enters the balance photoelectric detector through a polarization maintaining fiber. The novel wavemeter on the basis of magnetic rotation effect is unique and novel in principle, does not require a mechanical movable part and a reference laser device in installation, and can measure pulsed laser. The novel wavemeter on the basis of magnetic rotation effect has good vibration resistance, small volume, and low cost. The novel wavemeter on the basis of magnetic rotation effect has simple laser path and good alignment by utilizing all-fiber.
Owner:CHINA JILIANG UNIV

Method of speckle size and distribution control and the optical system using the same

A method of speckle size and distribution control and the optical system using the same are disclosed. The optical system is arranged inside a housing of a computer mouse that is primarily composed of a laser unit, a lens set, an image sensing unit and a digital signal processing unit. It is known that by projecting a laser beam onto a surface with sufficient roughness, the surface will exhibits a speckled appearance as the speckle pattern is a random intensity pattern produced by the mutual interference of coherent laser beam that are subject to phase differences and/or intensity fluctuations. Thus, the present invention provides an optical system capable of controlling the speckle sizes and the speckle pattern distribution by adjusting the bandwidth of a coherent laser beam being emitted out of the laser light source of the optical system as well as by adjusting the distance between an image plane of the digital signal processing unit and the rough surface being illuminated by the coherent laser beam, so that the distribution of the resulting speckle pattern and the size of each speckle thereof can match with the effective pixel size of different image sensing units used in the optical system. The method and optical system is advantageous in its simple optical path, by which the mechanical structure accuracy is minimized that facilitates and enhances manufacturers of different image sensing units to use speckle patterns for determining how far the optical system has moved and in which direction it is moved.
Owner:LEAHSIN TECH

Rapid protein analysis and detection device based on whole microfluidic chip closing system

The invention relates to a micro device for performing on-line enrichment, elution, fluorescence labeling and detection on protein, and in particular provides a rapid protein analysis and detection device based on whole microfluidic chip closing system. The device is composed of a micro fluidic controlling system, a miniature laser induced fluorescence detection system, a microfluidic chip, an injection valve, a connecting pipeline, an interface and a data acquisition and processing part. A protein sample is enriched by an enriching column in a chip passage, is subjected to on-line fluorescence labeling operation and elution operation at the same time, and is induced by laser to be subjected to fluorescence detection. The rapid protein analysis and detection device has the advantages that the sample pre-processing process, fluorescence labeling and detection are integrated so as to enable cumbersome steps of an off-line analysis method to be omitted, the sample processing time is greatly shortened and the high sensitivity detection is achieved; the whole device is small in size and low in energy consumption; the microfluidic chip and a micro injection pump are connected through the interface with a special design; a whole fluid system runs in the closing system, the detection requirement under a special condition (such as non-gravity state) can be met. Thereby, the rapid protein analysis and detection device has the very good practical application value.
Owner:DALIAN INST OF CHEM PHYSICS CHINESE ACAD OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products