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Terahertz wave spectrum measurement device based on filtering effect and measurement method

A measurement device and terahertz wave technology, applied in the field of spectrum detection, can solve the problems of large volume, high cost, and low resolution, and achieve the effects of small volume, low cost, and simple structure and optical path

Inactive Publication Date: 2017-05-31
NANJING UNIV OF POSTS & TELECOMM
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] The technical problem to be solved by the present invention is to overcome the shortcomings of the traditional terahertz spectrum measurement technology such as excessive volume, low resolution, and high cost, and provide a terahertz spectrum measurement device based on the filtering effect

Method used

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  • Terahertz wave spectrum measurement device based on filtering effect and measurement method
  • Terahertz wave spectrum measurement device based on filtering effect and measurement method
  • Terahertz wave spectrum measurement device based on filtering effect and measurement method

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Embodiment 1

[0041] The structural diagram of the terahertz spectrum measurement device based on the filtering effect in this embodiment is as follows figure 2As shown, it includes a terahertz wave collimation device, a filter 5 composed of a plurality of different filter films 6, a detector 4, and an optical translation stage (not shown in the figure) for controlling the position of the filter 5, in order to automatically realize For the numerical acquisition and calculation in the spectrum restoration process, this embodiment also includes a calculation processing unit (not shown in the figure) connected with the detector 4 signal. In this embodiment, the incident terahertz wave 1 to be measured first passes through the terahertz wave collimation device, which includes two confocal terahertz wave lenses 2 and a small The aperture diaphragm 3 is used to correct the parallelism and beam width of the incident terahertz wave. The reshaped terahertz wave 1 to be measured passes through a fi...

Embodiment 2

[0043] The structural diagram of the terahertz spectrum measurement device based on the filtering effect in this embodiment is as follows image 3 As shown, it includes a terahertz wave collimation device, a filter 7 composed of a plurality of different resonant frequency selection surfaces 8, a detector 4, and an optical translation stage ( image 3 not shown). The resonant frequency selection surfaces 8 can use the same metal plate or metal film as the substrate. Each resonant frequency selection surface 8 is provided with periodically distributed resonant units, and the resonant units on different resonant frequency selection surfaces 8 have different shapes or different geometric dimensions. Wherein, the filter 7 using the metal plate as the substrate can be made by mechanical processing, and the filter 7 using the metal thin film as the substrate can be made by ion etching or optical etching; the filter parameter controller is in In this embodiment, it is an optical tra...

Embodiment 3

[0047] Both Embodiment 1 and Embodiment 2 use the optical translation stage as a filter parameter controller to adjust the relative position of the filter 5 and the detector 4, so that the terahertz waves to be measured pass through different filter films 6 or Different resonant frequencies on the filter 7 are received by the detector 4 after selecting the surface 8 . In addition to this structure, the filters in Embodiment 1 and Embodiment 2 can also use a filter wheel structure. Such as Figure 4 As shown, the filter unit 10 on the wheel base 9 can use the filter film 6 or the resonant frequency selection surface 8 in Embodiment 1 and Embodiment 2, and the filter units 10 are distributed around the axis of the wheel base 9 . The filter parameter controller can choose a stepping motor, which can control the rotation of the wheel base 9 around the axis. Under various preset filtering conditions, the wheel base 9 rotates through different angles, and makes different filter uni...

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Abstract

The invention relates to a terahertz wave spectrum measurement device based on a filtering effect and a measurement method. By avoiding using the Fourier transformation method, there is no need to firstly acquire the time domain spectrum of to-be-measured terahertz waves and use a mechanical delay device, so the structure and the optical path are quite simple and the cost of the whole device is quite low. For filtering units corresponding to all kinds of preset filtering conditions, the terahertz waves have the same transmission wave spectrum in all emission parts and all emission directions of the filtering units. The terahertz waves are subjected to the same filtering function, so the stability of the spectrum measurement can be improved. By designing the terahertz wave spectrum measurement device based on the filtering effect and by solving of an equation system to recover the terahertz wave spectrum, the spectrum recovery scope and the resolution are free from restrictions of the movement range of a mechanical device and the repetition frequency of a femtosecond laser, so the resolution is quite high and the spectrum recovery range is quite wide.

Description

technical field [0001] The invention relates to a filter effect-based terahertz spectrum measurement device and a measurement method, belonging to the technical field of spectrum detection. Background technique [0002] In recent years, terahertz wave technology has developed rapidly, and has attracted extensive attention and research in many scientific fields such as astronomical remote sensing, public safety, high-speed communication, and biomedicine. Terahertz (THz) waves usually refer to frequencies between 0.1 and 10THz (1THz=10 12 Hz) electromagnetic waves with wavelengths between microwaves and near-infrared. Because terahertz wave photons have low energy, and many materials have characteristic absorption in the terahertz wave band, many non-metallic and non-polar materials are transparent in the terahertz wave band, terahertz spectroscopy has great application potential in nondestructive testing . However, the terahertz wave band is located at the junction of elec...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J3/30G01J3/02
CPCG01J3/30G01J3/0208G01J3/0229G01J3/027
Inventor 黄维杨涛蒋冰周馨慧李兴鳌仪明东沈骁何浩培
Owner NANJING UNIV OF POSTS & TELECOMM
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