Variable-cycle multi-beam interference photoetching method
Patent Information
- Authority / Receiving Office
- CN · China
- Current Assignee / Owner
- INST OF OPTICS & ELECTRONICS - CHINESE ACAD OF SCI
- Publication Date
- 2013-08-07
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Abstract
Description
technical field
[0001] The invention belongs to the technical field of nano-processing, and relates to a variable-period multi-beam interference photolithography method. technical background
[0002] Laser interference lithography has the advantages of high resolution, no mask, long focal depth, low cost, and high efficiency. Research fields such as anti-anti-absorption of solar cells play an important role.
[0003] The period of the laser interference lithography pattern is determined by the incident angles of the two mutually interfering beams. Therefore, in order to obtain micro-nano structures with different periods, the incident angles of the two interfering beams in the laser interference lithography system must be adjusted. For the traditional dual-arm laser interference lithography system with beam splitting by beamsplitter and beam combining by mirrors, in order to change the incident angle of the two beams, the optical paths of the two branches and the positions ...