Novel wavemeter on the basis of magnetic rotation effect

A technology of magneto-optical effect and wavelength meter, which is applied in the field of wavelength meter and can solve the problems of two-wavelength travel error, unable to read interference fringes, and increasing measurement error.

Inactive Publication Date: 2016-02-03
CHINA JILIANG UNIV
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Problems solved by technology

The optical path passed by the reference light is consistent with the light to be measured, but due to the different wavelengths, the number of interference fringes is different. When the mirror moves a distance L, the number of fringes generated by the reference laser is The number of stripes produced by the laser to be tested In this way, the wavelength of light to be measured is obtained By introducing a reference laser, the measurement accuracy of the Michelson interferometric wavelength meter can reach 10 -6 -10 -9 , but there are still many deficiencies in terms of cost and scope of use: (1) the reference laser generally uses a single longitudinal mode He-Ne laser, which has high cost, limited life, and high maintenance cost; (2) Michelson interference wavelength The accuracy of the meter is affected by the collimation of the reference light and the optical path of the light to be measured. When the angle between the light to be measured and the referen

Method used

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  • Novel wavemeter on the basis of magnetic rotation effect
  • Novel wavemeter on the basis of magnetic rotation effect
  • Novel wavemeter on the basis of magnetic rotation effect

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Embodiment Construction

[0045] The present invention will be further described below in conjunction with accompanying drawing:

[0046] like figure 1 As shown, it includes the laser to be tested (1), collimator (2), polarizer (3), magneto-optic crystal (4), permanent magnet (5), polarization beam splitter (6), temperature control system ( 7), balanced photodetector (8) and acquisition and analysis system (9).

[0047] combine figure 2 and image 3 Describe the specific embodiment of the present invention and the change process of light polarization state, in the present invention, the light that the laser to be measured (1) sends is collimated and enters the polarizer (3) through the collimator (2), and the polarizer of the polarizer Direction is image 3 As shown in the y direction, the outgoing light has the same polarization direction as the polarizer; then enters the magneto-optical crystal (4), the permanent magnet (5) produces a magnetic field parallel to the light propagation direction, a...

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Abstract

The present invention provides a novel wavemeter on the basis of magnetic rotation effect mainly for measuring wavelength of pulse laser or continuous laser. The novel wavemeter is characterized in that the novel wavemeter is composed of a laser device to be detected, a collimator, a polarizer, a magneto-optical crystal, a permanent magnet, a polarization beam splitter, a temperature-control system, a balance photoelectric detector and a collecting and analyzing system. The laser to be detected enters into the polarizer, the magneto-optical crystal and the polarization beam splitter through the collimator orderly, and deflects with an angle corresponding to the wavelength in the polarization state of the laser to be detected of the magneto-optical crystal according to the magnetic rotation effect. Two laser beams emitted by the polarization beam splitter enters the balance photoelectric detector through a polarization maintaining fiber. The novel wavemeter on the basis of magnetic rotation effect is unique and novel in principle, does not require a mechanical movable part and a reference laser device in installation, and can measure pulsed laser. The novel wavemeter on the basis of magnetic rotation effect has good vibration resistance, small volume, and low cost. The novel wavemeter on the basis of magnetic rotation effect has simple laser path and good alignment by utilizing all-fiber.

Description

technical field [0001] The invention relates to a wavelength meter, in particular to a novel wavelength meter for real-time measurement of laser wavelength based on magneto-optical rotation effect. Background technique [0002] The wavelength meter is used to measure the laser wavelength. Some lasers, such as tunable lasers, can use their tuning mechanism to adjust the wavelength of their output light in a wide range of wavelengths. When semiconductor lasers change their operating temperature and driving current, their output The wavelength of light will change, and the output wavelength under suitable working conditions should be determined in advance when using it. Most lasers must also be re-calibrated for their output wavelength after delivery and maintenance. As the most benchmark value for measurement, laser wavelength is an important parameter for laser performance testing. It is widely used in the measurement of various physical parameters. It is an important measure...

Claims

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Application Information

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IPC IPC(8): G01J9/04
Inventor 李裔单恩梅
Owner CHINA JILIANG UNIV
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