X-ray energy spectrum measurement method based on flat crystal diffraction imaging

A measurement method and X-ray technology, applied in the field of X-ray energy spectrum measurement, can solve the problems of low measurement efficiency, poor energy spectral resolution, and high energy spectral resolution, and achieve reduced accuracy requirements, high measurement efficiency, and simple optical path. Effect

Inactive Publication Date: 2016-07-13
NORTHWEST INST OF NUCLEAR TECH
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Problems solved by technology

The filter absorption method has a wide range of energy spectrum measurement, and can measure energy spectrum and angular distribution at the same time. However, due to indirect measurement, the energy spectrum resolution is poor, and large errors may occur in the inversion process; single-photon CCD can realize online measurement and obtain real-time The measurement results are easy to apply, but the resolution of the energy spectrum is low, and the upper limit of the energy spectrum measurement is low (limited by the response efficiency of the CCD pixel to X-rays, generally not higher than 30keV); the differential filtering method uses the transmittance of the filter material Poor characteristics Realize the segmental integral measurement of the energy spectrum, which is relatively simple to use, but

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  • X-ray energy spectrum measurement method based on flat crystal diffraction imaging
  • X-ray energy spectrum measurement method based on flat crystal diffraction imaging
  • X-ray energy spectrum measurement method based on flat crystal diffraction imaging

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[0067] The basic principle of crystal spectroscopy to measure the energy spectrum is to use crystal diffraction to convert the energy distribution of incident X-rays into the spatial intensity distribution of diffracted X-rays, and then according to the integral diffraction coefficient of the crystal for different energies, according to the diffraction intensity of different energies The incident intensity of the corresponding energy is calculated, that is, the energy spectrum of the incident X-ray. For a certain crystal plane, the diffraction energy and diffraction angle can be given by the Bragg relation

[0068] 2dsinθ B =nλ

[0069] Where d is the interplanar spacing, λ is the X-ray wavelength (the conversion relationship between X-ray wavelength and energy can be simply expressed as E=12.398 / λ), θ B Is the Bragg diffraction angle. The integral reflection coefficient of the crystal is the integral of the rocking curve corresponding to the diffraction energy of the crystal. Th...

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Abstract

The invention relates to an X-ray energy spectrum measurement method based on flat crystal diffraction imaging. By using the method, disadvantages that energy spectrum resolution is poor and measurement efficiency is low in an existing method are overcome. The method is suitable for multi-energy X-ray continuous energy spectrum measurement below 100keV. The method comprises the following steps of 1, estimating an energy spectrum scope of an X ray to be measured and determining a diffraction crystal parameter and a measurement system parameter; 2, carrying out imaging on all the diffraction angles in a diffraction angle scope and recording a diffraction image and a transmission image; 3, for a crystal determined in the step1, using a direct current X-ray source and an energy distinguishing detector to measure a rocking curve of each energy X ray to a diffraction crystal in the energy spectrum scope to be measured and calculating an integral diffraction coefficient; 4, according to the transmission image in the step2, calculating diffraction energy corresponding to each pixel of the diffraction image in the step2 so as to acquire an X-ray diffraction energy spectrum; and combining the integral diffraction coefficient of each energy to be measured in the step3 to calculate an incident X ray energy spectrum.

Description

technical field [0001] The invention belongs to the field of X-ray energy spectrum measurement, and relates to an X-ray energy spectrum measurement method based on flat crystal diffraction imaging. Background technique [0002] In the field of X-ray energy spectrum measurement, especially in pulsed X-ray measurement, energy spectrum is a very important parameter. At present, there are many energy spectrum measurement methods, including crystal spectroscopy, filter absorption method, single photon CCD measurement, differential filter method, etc., and the corresponding energy spectrum inversion algorithm has been developed. [0003] The above existing methods all have certain advantages, but also have certain problems. The filter absorption method has a wide range of energy spectrum measurement, and can measure energy spectrum and angular distribution at the same time. However, due to indirect measurement, the energy spectrum resolution is poor, and large errors may occur in...

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Application Information

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IPC IPC(8): G01T1/36
CPCG01T1/366
Inventor 马戈黑东炜唐波魏福利罗剑辉周海生夏惊涛李斌康盛亮
Owner NORTHWEST INST OF NUCLEAR TECH
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