X-ray energy spectrum measurement method based on flat crystal diffraction imaging
A measurement method and X-ray technology, applied in the field of X-ray energy spectrum measurement, can solve the problems of low measurement efficiency, poor energy spectral resolution, and high energy spectral resolution, and achieve reduced accuracy requirements, high measurement efficiency, and simple optical path. Effect
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[0067] The basic principle of crystal spectroscopy to measure the energy spectrum is to use crystal diffraction to convert the energy distribution of incident X-rays into the spatial intensity distribution of diffracted X-rays, and then according to the integral diffraction coefficient of the crystal for different energies, according to the diffraction intensity of different energies The incident intensity of the corresponding energy is calculated, that is, the energy spectrum of the incident X-ray. For a certain crystal plane, the diffraction energy and diffraction angle can be given by the Bragg relation
[0068] 2dsinθ B =nλ
[0069] Where d is the interplanar spacing, λ is the X-ray wavelength (the conversion relationship between X-ray wavelength and energy can be simply expressed as E=12.398 / λ), θ B Is the Bragg diffraction angle. The integral reflection coefficient of the crystal is the integral of the rocking curve corresponding to the diffraction energy of the crystal. Th...
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