Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Measuring equipment of electron accelerator output beam parameter

A technology for electron accelerators and measuring devices, which is applied in the directions of measuring devices, radiation measurement, X-ray energy spectrum distribution measurement, etc. It can solve the problems that the energy of the electron beam irradiated by the electron accelerator cannot be truly reflected, and the detection parameters of the device are single.

Active Publication Date: 2012-04-25
广东雷大科技有限公司
View PDF5 Cites 13 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

"That is to reflect the energy of the electron beam by converting the electric signal converted by the charge accumulated on the absorbing plate, but one is that the detection parameter of the device is single, and the other is that the device is installed on the edge of the titanium window, which cannot truly reflect the radiation of the electron accelerator. electron beam energy

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Measuring equipment of electron accelerator output beam parameter
  • Measuring equipment of electron accelerator output beam parameter
  • Measuring equipment of electron accelerator output beam parameter

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0011] A measuring device with a rated output electron beam energy of 10MeV electron accelerator output beam current parameters is a comprehensive measurement device for electron accelerator output beam current, energy spectrum and scanning uniformity, including a measurement data collector and its control mechanism. Its structure is as follows: figure 1 , 2 , 3, 4 shown. The measurement data collector has a housing 6 , an electronic absorption rod 7 and an electronic absorption plate 8 . The upper opening of the casing is open, and its length and width are greater than the length and width of the scanning output window of the electron accelerator under test. A row of 12 electron absorbing rods is installed on the uppermost layer of the housing through the ceramic insulating pad according to the width direction of the housing. The electron absorbing rod is an aluminum rod with a square section with a side length of 30mm. One side of the aluminum rod is perpendicular to the al...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides measuring equipment of an electron accelerator output beam parameter. The measuring equipment comprises: an electron absorption board (8) and a plurality of electron absorption rods (7), wherein the each electron absorption rod is insulated with other components. The electron absorption rods possess a same rectangular section which is parallel to the electron absorption board. A length direction is parallel to the width direction of an accelerator scanning output window (11). Side surfaces with the same width of the electron absorption rods are vertical to an electron ray direction which is located in a position of the electron absorption rods. The electron absorption board and each electron absorption rod are connected to a current measurement device through leads respectively. Compared to the prior art, by using the measuring equipment of the invention, the electron beam energy measurement is integrated with the scanning uniformity measurement. Therefore, amounts of the accelerator output beam, a spectral distribution situation, the scanning uniformity can be simultaneously determined. The equipment and the apparatus needed by electron beam output parameter measurement can be simplified. In the prior art, the different apparatuses are needed by the electron beam energy measurement and the electron beam scanning uniformity measurement. By using the measuring equipment of the invention, the above problem can be solved.

Description

technical field [0001] The invention relates to a measuring device for the output beam parameters of an electron accelerator, which is a device for comprehensively measuring the output electron beam intensity, energy spectrum distribution and scanning uniformity of the electron accelerator, especially a parameter data acquisition device. Background technique [0002] The electron accelerator involved in the present invention is a device that accelerates electrons close to the speed of light, and then irradiates the object to be irradiated through the accelerator scanning output window (commonly known as titanium window). The output beam current of the titanium window, that is, the intensity, energy spectrum distribution and scanning uniformity of the electron acceleration beam directly affect the irradiation effect of the irradiated object, while the electron beam outside the output window of the accelerator scans, the electrons contained in it Except that the ray is a strai...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01T1/29G01T1/36
Inventor 陆锐锋王超其
Owner 广东雷大科技有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products