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Single photon detection method and system for faults of integrated circuit

A technology of integrated circuits and detection methods, applied in the direction of digital circuit testing, electronic circuit testing, etc., can solve problems such as failure to work normally, time-delay faults, and functional errors

Inactive Publication Date: 2013-09-04
SOUTH CHINA NORMAL UNIVERSITY
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0006] (2) Delay fault
Logic and timing problems caused by signal integrity can lead to unstable operation of circuit chips; functional errors occur, and even cannot work normally

Method used

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  • Single photon detection method and system for faults of integrated circuit
  • Single photon detection method and system for faults of integrated circuit
  • Single photon detection method and system for faults of integrated circuit

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Embodiment Construction

[0035] The specific implementation of the present invention will be further described below in conjunction with the accompanying drawings, but for those skilled in the art, the above content has fully disclosed the present invention, so the following content is not used to limit the implementation and protection scope of the present invention.

[0036] Such as figure 1 As shown, a single photon detection system for integrated circuit faults, its detection process includes: the generation and application of test vectors, the tested integrated circuit receives the test vector data, the single photon detector detects the luminous signal, and then the system performs photon counting , test analysis, test data output display, etc. The following is divided into four parts for description.

[0037] (1) A single-photon detection system for integrated circuit faults. Its realization process is: apply a set test vector to the original input end of the integrated circuit under test, so ...

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Abstract

The invention provides a single photon detection method and system for faults of an integrated circuit. According to the detection method, a set test vector is applied to a tested circuit, so that signal transition at the faults occurs, so that weak light is generated; and the weak light for the faults is detected by adopting a single photon detector. The detection system comprises a tested integrated circuit, an photon counting circuit module, a signal generator and a microcomputer, wherein the microcomputer is used for controlling the work of the whole system; and the microcomputer is also used for receiving detection data transmitted by the photon counting circuit module and comparing and analyzing the detection data with data in a database so as to realize detection and positioning of the faults in the circuit. According to the single photon detection method and system provided by the invention, various faults such as fixed faults, bridging faults, signal integrity faults and the like in the integrated circuit can be directly detected and positioned, and thereby the quality and the reliability of circuit chip products are improved.

Description

technical field [0001] The invention belongs to the field of integrated circuit testing, and relates to a system for detecting faults in integrated circuit chips through single photon detection and an implementation method thereof. Background technique [0002] In the production and maintenance of integrated circuits, testing has always been a very important task. In recent years, with the increase of the scale of integrated circuits, the problem of circuit testing has become increasingly acute. The cost of testing accounts for a large part of the total cost of products. The proportion is increasing, so testing has become an important part of the circuit design and production process. [0003] The main purpose of circuit testing is to verify whether the circuit meets the design requirements or whether the function is normal. An important work that needs to be done is to design a test generation method, also known as a test vector generation algorithm (referred to as test gen...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/317
Inventor 潘中良陈翎李炜吴培亨
Owner SOUTH CHINA NORMAL UNIVERSITY
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