Method and device for ageing three-phase rectifier bridges

Abstract

The invention discloses a method and a device for ageing three-phase rectifier bridges. The method is that an ageing device is utilized to perform batch ageing of the three-phase rectifier bridges. The three-phase rectifier bridges to be tested are clamped on clamps at an ageing area of a device, and a connecting terminal of a high voltage output control unit and a connecting terminal of a current control unit on the device are connected with the three-phase rectifier bridges to be tested. A temperature-measuring unit is fixed on a cooling fin at the ageing area and connected with a temperature displaying control unit, and the temperature displaying control unit is connected with a cooling fan unit. The current control unit and the high voltage output control unit are respectively connected with a test parameter displaying unit. The current control unit is respectively connected with a low voltage alternating current power supply adjusting unit and a synchronous trigger control unit. The method and the device for ageing the three-phase rectifier bridges can perform dynamic ageing to inner tubes of the three-phase rectifier bridges completely, perform batch selection and avoid the earlier failure of the three-phase rectifier bridges or circuit faults due to the fact that the three-phase rectifier bridges cannot bear large-loading impact. The method and the device for ageing the three-phase rectifier bridges aim at meeting the requirements of customers for quality grade of products and guaranteeing product reliability.

Description

technical field [0001] The invention relates to an aging method and device for a three-phase rectifier bridge, belonging to the technical field of semiconductor aging equipment. Background technique [0002] As market competition becomes more and more fierce, customers have higher and higher requirements for product quality grades, and the reliability of a product directly affects whether it can gain a foothold in the market. The reliability of semiconductor devices that have not been screened by aging cannot be guaranteed, and they are prone to early failure or cannot withstand the impact of large loads, which may easily cause circuit failures and cause irreparable losses to customers. In response to this situation, equipment manufacturers have developed and designed many semiconductor device aging screening equipment, but these aging screening equipment do not have rectifier bridge aging screening equipment. At present, the performance screening of three-phase rectifier b...

AI Technical Summary

Problems solved by technology

At present, the performance screening of three-phase rectifier bridges is mainly carried out through simple measurement methods. On the one hand, batch aging screening cannot be performed; on the other hand, it is impossible to completely simulate the normal working state of three-phase rectifier bridge

Unable to meet customers' higher and higher requirements for product quality grades, and unable to guarantee product reliability, unaged three-phase rectifier bridges will cause early failure or cannot withstand the impact of large loads, easily causing circuit failures

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