Slit flow stability control device

A technology of stability control and gap, applied in microscopes, optics, instruments, etc., can solve the problems of the sealing liquid being pulled into the observation area, the lack of stability and reliability, and the aggravation of boundary instability, so as to avoid adverse effects. , Improve the quality of observation and avoid the effect of impact

Inactive Publication Date: 2013-12-04
FUZHOU UNIV
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Problems solved by technology

[0006] 2) The currently used liquid supply recovery structure is not stable and reliable enough under the condition of continuous liquid renewal
However, the way of applying energy, while suppressing the leakage of the boundary liquid, also aggravates the instability of the boundary
Especially under the condition that the substrate moves rapidly from the observed area to the next observed area, if there is no effective control, the gas sealing method will easily lead to the entrainment of air bubbles into the flow field, while the liquid sealing method may cause the sealing liquid to be drawn into the observation area. in the area and interfere with the observation

Method used

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Embodiment Construction

[0033] The specific implementation of the present invention will be described below in conjunction with the drawings and examples.

[0034] figure 1 Schematically shows the assembly of the slit flow stability control device and the lens group of the embodiment of the present invention, the slit flow stability control device 3 arranged between the lens group 2 and the base 4 can be used in a microscope such as an immersion microscope 1 application in the device. In actual observation, the light on the surface of the substrate 4 (silicon wafer or liquid crystal substrate, etc.) is captured by related equipment for microscopic analysis through the liquid slit layer above the substrate 4 and the lens group 2 . For the consideration of equipment utilization and economy, immersion microscopic observation can have two modes: direct visual inspection and image analysis. If the wavelength of the observation light is visible light, it can be directly observed through the eyepiece 5; i...

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Abstract

The invention discloses a slit flow stability control device, which is characterized in that: the slit flow stability control device is arranged between a lens system and a base, and a diversion trench array is arranged below a liquid injection cavity and two ends and the outside of a recovery cavity are provided with internal recovery damping row holes and external recovery damping raw holes, so that the stable and reliable liquid continuous updating state in an observation area is maintained. A liquid input into the liquid injection cavity forms jet flow uniformly pointing to the recover cavity and flows uniformly and stably under the guidance of the diversion trench array. Under the working condition that the base moves, the internal recovery damping row holes have an effect of assisting in recovery, and the external recovery row holes absorb possibly leaked liquid drops in real time, so that a multi-layer liquid recovery barrier is formed. In addition, a seal is not required at the periphery of a flow field of the device, a system is simplified, the impact of extra energy on the boundary of the flow field is avoided, and the system has high stability and reliability.

Description

technical field [0001] The invention relates to a slit flow stability control device in an immersion microscope system, in particular to a slit flow stability control device for an immersion microscope (Immersion Microscope). Background technique [0002] In industries such as semiconductors, fault analysis and reliability evaluation of tiny electronic devices are the key to ensuring yield. The usual way is to use the electronic device as a sample and observe it under a microscope to determine whether there are defects or impurities that affect the normal operation of the device. However, as the characteristic line width of electronic devices continues to shrink below 32 nanometers, and the size of substrates (such as semiconductor silicon wafers) continues to increase, the technical cost of traditional observation methods is rising rapidly. [0003] The immersion microscope system, by filling the gap between the front end of the objective lens and the substrate (such as si...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G02B21/33
Inventor 陈晖杜恒陈淑梅陈传铭
Owner FUZHOU UNIV
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