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Multi-station positioning device for testing integrated circuits

An integrated circuit and positioning device technology, applied in the field of multi-position positioning device for integrated circuit testing, can solve the problems of low test efficiency, poor contact between test contacts and test terminals, etc., and achieve simple and reliable structure, simple structure, and stable lifting Effect

Active Publication Date: 2012-08-15
HANGZHOU CHANGCHUAN TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The purpose of the present invention is to overcome the current low test efficiency and easy to cause poor contact between the test contact and the test terminal, to provide a test integrated circuit with high efficiency and good contact between the test contact and the test terminal. Multi-station positioning device for integrated circuit testing

Method used

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  • Multi-station positioning device for testing integrated circuits
  • Multi-station positioning device for testing integrated circuits
  • Multi-station positioning device for testing integrated circuits

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0024] Embodiment 1, as attached figure 1 , attached figure 2 , attached image 3 Shown: a multi-position positioning device for integrated circuit testing, including a mounting base 4, a feeding track 3 fixedly connected to the mounting base 4, four test contacts 1, and used to distribute the integrated circuit to each test contact 1 The grading mechanism, the grading drive mechanism, the push mechanism that pushes the test contact 1 to contact the integrated circuit test end, the push drive mechanism, the cushion block 2 for cushioning the integrated circuit test end, and the cushion block lifting mechanism.

[0025] The mounting seat 4 includes a base plate 41, a fixed plate 42 and a connecting rod 43; there are four connecting rods 43, and the base plate 41 has a through hole 44; Both sides, fixed plate 42 is welded with base plate 41 by connecting rod 43, and feed track 3 is connected with base plate 41 screws; Feed track 3 has feed groove 31 and terminal groove 32 alo...

Embodiment 2

[0033] Embodiment 2, as attached Figure 4 , attached Figure 5 , attached Figure 6 Shown: a multi-position positioning device for integrated circuit testing, including a mounting base 4, a feeding track 3 fixedly connected to the mounting base 4, four test contacts 1, and used to distribute the integrated circuit to each test contact 1 The grading mechanism, the grading drive mechanism, the push mechanism that pushes the test contact 1 to contact the integrated circuit test end, the push drive mechanism, the cushion block 2 for cushioning the integrated circuit test end, and the cushion block lifting mechanism.

[0034] The mounting seat 4 includes a base plate 41, a fixed plate 42 and a connecting rod 43; there are four connecting rods 43, and the base plate 41 has a through hole 44; Both sides, fixed plate 42 is welded with base plate 41 by connecting rod 43, and feed track 3 is connected with base plate 41 screws; Feed track 3 has feed groove 31 and terminal groove 32 a...

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Abstract

The invention relates to the field of integrated circuit testing equipment, and aims to provide a multi-station positioning device for testing integrated circuits, which is high in integrated circuit testing efficiency. Testing contacts of the multi-station positioning device keep good contact with testing ends. The multi-station positioning device for testing the integrated circuits comprises a mounting seat, a feeding track, a plurality of testing contacts, a distributing mechanism, a distributing driving mechanism, a pushing mechanism and a pushing driving mechanism, the feeding track is fixedly connected with the mounting seat, the distributing mechanism is used for distributing the integrating circuits to the testing contacts, the pushing mechanism pushes the testing contacts to contact with testing ends of the integrated circuits, the distributing driving mechanism is respectively fixedly connected with the distributing mechanism and the mounting seat, and the pushing driving mechanism is respectively fixedly connected with the pushing mechanism and the mounting seat. The multi-station positioning device for testing the integrated circuits is high in integrated circuit testing efficiency, and the testing contacts keep good contact with the testing ends.

Description

technical field [0001] The invention relates to the field of integrated circuit testing equipment, in particular to an integrated circuit testing multi-station positioning device with high efficiency for testing integrated circuits and good contact between test contacts and test terminals. Background technique [0002] Integrated circuits are mass-produced and multiple tests are required. The workload is very large and the contact between the test terminals of the integrated circuits and the test contacts of the test device must be in good contact to make the test accurate. At present, multiple tests of integrated circuits are often performed by multiple The integrated circuit needs to be transferred between multiple testing procedures, and the test terminal of the integrated circuit is often inserted into the socket with the test contact of the test device for testing; because the integrated circuit needs to be tested during the test process Turning and plugging multiple ti...

Claims

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Application Information

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IPC IPC(8): G01R31/28
Inventor 叶键波韩笑王维
Owner HANGZHOU CHANGCHUAN TECH CO LTD
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