Low-temperature accessory for X-ray diffractometer

Abstract

The invention discloses a low-temperature accessory for an X-ray diffractometer, belonging to the technical field of X-ray diffractometers. The low-temperature accessory comprises a main body assembly, a tank body, an upper cover, a fixing connecting device of the upper cover, a heating piece assembly, a cooling tube assembly and a sample box, wherein the upper cover is in sealing connection with the tank body; the heating piece assembly is arranged inside the tank body; the cooling tube assembly is connected with the heating piece assembly; the sample box is arranged above a heating plate of the heating piece assembly; the heating piece assembly is internally provided with a cavity; the cavity is communicated with the cooling tube assembly; the upper cover is provided with an air inlet channel communicated with the tank body internally; an air outlet channel is formed at the other end of the tank body; an air discharge port is connected with the air outlet channel; the main body assembly for installation is connected with one end (where the air outlet channel is arranged) of the tank body; a standby plug is arranged on the air inlet channel; and a heating plate of the heating piece assembly is connected with a PID (Proportion Integration Differentiation) adjustor. According to the low-temperature accessory, the liquid nitrogen is adopted for refrigeration; the sample box is heated by using the PID to adjust and control the heating quantity, thus the sample is stabilized at a set temperature. The heating plate is made of silicon carbide and has the advantages of fast heating, small deformation and high precision.

Description

technical field [0001] The invention belongs to the technical application field of X-ray diffractometer, and in particular relates to a low-temperature accessory for X-ray diffractometer. Background technique [0002] X-ray diffractometer is a device for studying the crystal structure of materials. The goniometer of X-ray diffractometer is designed according to the principle of Bragg diffractometer: nλ=2dsinθ. Using the different angles of reflection lines on the surface of the sample, the structure of the material, The grain size and crystallinity were tested. Conventional diffractometers cannot study the structural changes of materials in the temperature range from -190°C to +450°C, especially for X-ray diffraction analysis of materials at low temperatures. Contents of the invention [0003] Aiming at the above-mentioned technical problems, the present invention provides a low-temperature accessory for X-ray diffractometer, which is used to study the change of the cryst...

AI Technical Summary

Problems solved by technology

Conventional diffractometers cannot study the structural changes of materials in the temperature range of -190 degrees to +450 degrees, especially the X-ray diffraction analysis of materials at low temperatures.

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