Method for testing relative spectral responsivity of grating type imaging spectrometer
An imaging spectrometer and spectral response technology, which is applied in spectrum investigation and other directions, can solve problems such as not being able to meet the measurement accuracy requirements of imaging spectrometers, and achieve the effects of easy implementation, strong versatility, and simple operation
Active Publication Date: 2014-11-05
CHINA NORTH IND NO 205 RES INST
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[0007] At present, the relative spectral responsivity of the grating imaging spectrometer is generally considered to be the spectral responsivity of the CCD photodetector inside the imaging spectrometer. The influence of quality, distortion, and spectroscopic conditions on the relative spectral responsivity of grating imaging spectrometers cannot be ignored. Only the relative spectral responsivity of CCD photodetectors is used to represent the spectral responsivity of the whole system of grating imaging spectrometers. Requirements for the actual measurement accuracy of the spectrometer
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[0027] The present invention will be further described in detail below in conjunction with the accompanying drawings and preferred embodiments.
[0028] In order to accurately test the relative spectral responsivity of the grating imaging spectrometer, the general idea of the present invention is to select an integrating sphere standard light source with known spectral radiation power, and the uniform optical signal emitted by the standard light source enters the grating type The imaging spectrometer, combined with the imaging and spectroscopic characteristics of the grating imaging spectrometer, collects the output signal of the grating imaging spectrometer by the computer signal acquisition and data processing system, and performs corresponding processing and calculation, so as to realize the relative spectral responsivity of the grating imaging spectrometer. Accurate test.
[0029] according to figure 1 As shown, the grating imaging spectrometer generally consists of a t...
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The invention discloses a method for testing spectral responsivity of an imaging spectrometer and belongs to the field of optical measurement and test. Because the grating type imaging spectrometer integrates the characteristics of an optical imaging system and a spectral beam-splitting system, the influence of the imaging quality, distortion and the like of the optical system of the grating type imaging spectrometer on the spectral responsivity of the imaging spectrometer is of vital importance; and therefore, if only the spectral responsivity of a charge coupled device (CCD) photoelectric detector is tested, the testing requirements of the imaging spectrometer cannot be met. By the method, the spectral responsivity of the grating type imaging spectrometer is accurately tested, the problem that the spectral responsivity of the conventional grating type imaging spectrometer cannot be accurately tested is solved, and the blank in the field of measurement of the spectral responsivity of the grating type imaging spectrometer is filled up. The method is simple to operate and easy to implement.
Description
technical field [0001] The invention belongs to the field of optical metrology and testing, and mainly relates to a method for testing the spectral responsivity of an imaging spectrometer, in particular to a method for testing the relative spectral responsivity of a grating imaging spectrometer. Background technique [0002] Photodetectors play an important role in modern optical technology and optical engineering. Photodetectors convert light radiation into electricity, and their role is to detect signals, measure signals, and extract the necessary signals for applications. The photodetector is the key component of the imaging spectrometer to realize photoelectric conversion, and its performance will affect the performance of the entire imaging spectrometer. [0003] The response of the actual detector to optical radiation will have wavelength selectivity, and the spectral responsivity refers to the responsivity at different wavelengths. There are two basic measurement me...
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IPC IPC(8): G01J3/28
Inventor 李燕占春连李正琪卢飞范纪红
Owner CHINA NORTH IND NO 205 RES INST