Dual-temperature zone single probe capable of realizing automatic identification and error correction and automatic error correction method thereof

Abstract

The invention discloses a dual-temperature zone single probe capable of realizing automatic identification and error correction, which comprises two identical sensors A and B and a fault detection unit for detecting whether the sensors have faults or not, wherein the consistency between the sensor A and the sensor B is less than 0.1 DEG C; and the fault detection unit is connected with the sensor A and the sensor B respectively. The invention also discloses an automatic error correction method of the dual-temperature zone single probe capable of realizing automatic identification and error correction. The dual-temperature zone single probe disclosed by the invention has high reliability, avoids deviation of the temperature requirement of a cold storage warehouse caused by the damage of a single sensor, and prevents the property loss.

Description

Technical field [0001] The invention relates to a temperature measuring probe, in particular to a high-reliability dual temperature zone single probe capable of automatically identifying and correcting errors and an automatic error correction method of the probe. Background technique [0002] At present, most of the temperature measuring probes used in the field of refrigeration and refrigeration are thermistor type temperature sensors. This kind of temperature sensor has an NTC sensor enclosed in a probe. The sensor itself does not have an accurate fault detection function, but only provides a resistance that changes with temperature. The value is used for the calculation of the SCM system. [0003] When the refrigeration system is working, the temperature probe will inevitably experience faults such as short circuit, open circuit, temperature drift, etc. When a short circuit or open circuit fault occurs, although the system can detect the fault, the system will have to stop the ...

AI Technical Summary

Problems solved by technology

When a short-circuit or open-circuit fault occurs, although the system can detect the fault, the system will have to suspend the system sub-functions involved in this signal; when the system sensor has a temperature drift fault, the traditional sensor will not be able to know the occurrence of this fault or not

The one-in-ten-thousandth probability of damage to the temperature sensor will cause a temperature deviation fault during the operation of the cold storage unit, resulting in a deviation in the temperature requirements of the cold storage and eventually resulting in property loss.

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