Method and device for measuring wide spectral transmittance in 0-70-degree incidence of optical film
An optical film and measurement method technology, which is applied in transmittance measurement and other directions, can solve the problems of narrow working band, increased transmittance measurement error, and high cost, and achieves the effect of simple operation steps and improved accuracy.
Inactive Publication Date: 2015-04-15
TONGJI UNIV
View PDF4 Cites 0 Cited by
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
However, the polarizers used in the test are partial polarizers, so the measurement error of the transmittance increases rapidly with the increase of the incident angle
The extinction ratio of the polarizer changes with the wavelength, and usually its operating band is narrow, which cannot meet the requirements of wide-spectrum transmittance measurement
The cost of using a combination of multiple high-performance polarizers working in different wavelength bands to measure wide-spectrum transmittance is very high
Method used
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View moreImage
Smart Image Click on the blue labels to locate them in the text.
Smart ImageViewing Examples
Examples
Experimental program
Comparison scheme
Effect test
Embodiment
[0037] The device of the present invention is as figure 2 , 3 As shown, it includes a light source 1 , a polarizer 2 , a transmission member 3 and a detector 4 . The light source 1, the polarizer 2, the transmission element 3 and the detector 4 are sequentially arranged along a straight line, the light source 1 generates polarized light through the polarizer 2, the polarized light reaches the detector 4 through the transmission element 3, and the light intensity is measured by the detector 4 , the transmittance of the transmissive member 3 can be calculated according to the light intensity.
[0038] Concrete steps of the method of the present invention are as figure 1 As shown, when performing steps S2-S6, the transmission member 3 used is a substrate, and the substrate is an uncoated test sample; when performing steps S8 and S9, the transmission member 3 used is a test sample. In this embodiment, The test sample is a flat polarizing beam splitter whose center working wave...
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More PUM
| Property | Measurement | Unit |
|---|---|---|
| angle of incidence | aaaaa | aaaaa |
Login to View More
Abstract
The invention relates to a method and a device for measuring the wide spectral transmittance in 0-70-degree incidence of an optical film. The method specifically comprises the following steps of: 1) measuring the transmittance T0-degree of a substrate when the incidence angle is 0 degree; 2) calculating a theoretic value sum of transmittances of an S-light and a P-light when the incidence angle of the substrate is alpha according to the transmittance measured in the step 1); 3) measuring a measurement value sum of the transmittances of the S-light and the P-light when the incidence angle of the substrate is alpha; 4) calculating a polarization characteristic factor p; 5) replacing the substrate with a testing sample, and respectively measuring the measurement value sum of the transmittances of the S-light and the P-light when the incidence angle of the testing sample is alpha; and 6) calculating the transmittances TS and TP of the S-light and the P-light of the testing sample. Compared with the prior art, the method eliminates the influence of polarization factors to the measurement result and improves the measurement precision; and moreover, the conversion between the S-light and the P-light is realized by rotating the incidence side of the testing sample in the measurement, so that the requirements on the precision of a polarizer are reduced, and as a result, the measurement cost is reduced.
Description
technical field [0001] The invention relates to a method and device for measuring transmittance, in particular to a method and device for measuring wide-spectrum transmittance of an optical film incident at 0-70°. Background technique [0002] When measuring the wide-spectrum transmittance at 0-70° oblique incidence, traditional measurement methods need to rely on polarizers to switch between P light (light vector parallel to the incident surface) and S light (light vector perpendicular to the incident surface), and require The polarizer is an ideal polarizer, and this requirement is very strict. However, the polarizers used in the test are partial polarizers, so the measurement error of the transmittance increases rapidly with the increase of the incident angle. The extinction ratio of the polarizer varies with the wavelength, and usually its operating band is narrow, which cannot meet the requirements of wide-spectrum transmittance measurement. The cost of using a combin...
Claims
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More Application Information
Patent Timeline
Login to View More Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/59
Inventor 刘永利张锦龙程鑫彬马彬焦宏飞丁涛韩金张艳云王玲王占山
Owner TONGJI UNIV