PUF (Physical Unclonable Function) On-chip self enrollment system based on SRAM (Static Random Access Memories) of PUF and implementation method thereof

Abstract

The invention relates to a PUF (Physical Unclonable Function) on-chip self enrollment system based on SRAMs (Static Random Access Memories) and an implementation method thereof. The invention has the technical characteristics that the system comprises a BISE (Built-in Self Enrollment) controller, a voltage regulator, a temperature regulator, an accumulator, an SRAM 1 and an SRAM2; the output end of the BISE controller is connected to the voltage regulator and the temperature regulator, the output ends of which are connected to the SRAM2; the BISE controller is respectively connected with the SRAM1, the SRAM2 and the accumulator; the SRAM1 and the SRAM2 are respectively connected with two input ends of the accumulator; the output end of the accumulator is connected to the SRAM1; and the SRAM 1 outputs a PUF unit. The implementation method includes the steps that: 1, the BISE controller enters detection mode 0 from initial state, detects and outputs the PUF unit under the detection mode0; and 2, the BISE controller automatically enters detection mode1, detects and outputs the PUF unit under the detection mode 1. The on-chip self enrollment system can be widely integrated in the chips which need protection and has the characteristics of reasonable design, high reliability and convenience in usage.

Description

technical field [0001] The invention belongs to the technical field of integrated circuits, in particular to an SRAM-based PUF on-chip self-registration system and an implementation method thereof. Background technique [0002] The anti-counterfeiting of traditional chips relies on various encryption algorithms, and key secrets / keys are stored in the system (such as in non-volatile memory), which can be copied or easily leaked. In addition, since the non-volatile memory is difficult to produce in a process below 90nm, the chip anti-counterfeiting system design needs a revolution. [0003] At present, chip designers and production technicians are working hard to eliminate Process Variation to ensure that each chip produced is exactly the same as the next one. However, the process difference cannot be completely eliminated. We can use this process difference to distinguish each chip. This process difference can be regarded as the fingerprint of the chip, that is to say, each...

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Problems solved by technology

The problems with the above methods are: (1) The error correction technology is not a panacea, which is due to the unreliability of the selected PUF due to the sensitivity of the physical characteristics of the selected PUF to environmental changes such as temperature and voltage, and the success of the error correction technology It will depend on the selection of stable and reliable PUF units; (2) Statistical techniques make chip registration very troublesome, because the chip registration process is the process of obtaining stable physical characteristics through repeated experiments in different environments and recording them. This process hinders the practical application of PUF verification

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