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Semiconductor arrangement with an integrated Hall sensor

A Hall sensor and semiconductor technology, applied in the direction of semiconductor devices, electric solid devices, devices using electro-magnetic effects, etc., can solve problems such as combined current measurement loss

Active Publication Date: 2013-04-03
INFINEON TECH AUSTRIA AG
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Although the load and measurement transistors can be configured such that the measurement current is much smaller than the load current, there is still a loss in the combined current measurement

Method used

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  • Semiconductor arrangement with an integrated Hall sensor
  • Semiconductor arrangement with an integrated Hall sensor
  • Semiconductor arrangement with an integrated Hall sensor

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Embodiment Construction

[0015] In the following description, reference is made to the accompanying drawings which form a part hereof, and in which is shown by way of illustration specific embodiments in which the invention may be practiced. In this regard, directional terms such as "top", "bottom", "front", "rear", "head", "tail" and the like are used with reference to the orientation of the figures being described. Since components of an embodiment may be positioned in many different orientations, directional terms are used for purposes of illustration and are in no way limiting. It is to be understood that other embodiments may be utilized and structural or logical changes may be made without departing from the scope of the present invention. Accordingly, the following detailed description is not to be taken in a limiting sense, and the scope of the invention is defined by the appended claims. It will be understood that the features of the various exemplary embodiments described herein may be comb...

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Abstract

The invention relates to a semiconductor arrangement with an integrated Hall sensor. The semiconductor arrangement includes a semiconductor body and a semiconductor device, the semiconductor device including first and second load terminals arranged distant to each other in a first direction of the semiconductor body and a load path arranged in the semiconductor body between the first and second load terminals. The semiconductor arrangement further includes at least one Hall sensor arranged in the semiconductor body distant to the semiconductor device in a second direction perpendicular to the first direction. The Hall sensor includes two current supply terminals and two measurement terminals.

Description

technical field [0001] Embodiments of the present invention relate to a semiconductor device having a semiconductor device such as a transistor and a current measuring device. Background technique [0002] Transistors are widely used as switches for switching current supplied to a load. In many applications it is desirable to measure current through a load. Several different concepts are known for measuring current through transistors and loads respectively. [0003] According to a first concept, a shunt resistor is connected in series with the transistor, and the voltage across the resistor is measured. According to Ohm's law, this voltage is proportional to the current through the transistor. However, shunt resistors cause power loss. [0004] According to another concept, a measurement transistor is provided operating in the same operating point as the load transistor connected in series with the load such that the measurement current through the measurement transisto...

Claims

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Application Information

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IPC IPC(8): H01L27/02H01L27/06
CPCH01L27/0617H01L29/7787B82Y10/00H10N59/00H10N52/101H10B61/00
Inventor H.安格雷尔L.格尔根斯F.希尔勒G.波佐维沃W.里格尔M.聪德尔
Owner INFINEON TECH AUSTRIA AG
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