Wafer Map display model and application method thereof

Abstract

The invention provides a wafer Map display model and an application method thereof. The method includes: building a dynamic linking library WaferMapDll firstly, building a derived class CWaferMap based on CStatic, building a wafer Map coordinate model, regarding each crystal grain as a point, and distributing a coordinate for each crystal grain; judging whether the distributed coordinates are in the range of a wafer, drawing small checks representing inner crystal grains of the wafer according to the crystal grains in the range of the wafer, and forming a wafer Map display image; building a binary file for storing crystal grain information and zoomed redrawn crystal grain test conditions, calculating a storage address of the information of each crystal grain in the file, and writing the crystal grain information in the file; obtaining a motor pulse coordinate of a current crystal grain, calculating a Map coordinate of a current crystal grain according to the motor pulse coordinate and a wafer central motor pulse coordinate, and marking and storing the corresponding crystal grains displayed on a Map image in the binary file. The wafer Map display model and the application method of the wafer Map display model are multifunctional, strong in portability and high in flexibility.

Description

technical field [0001] The invention relates to the technical field of semiconductor device testing, in particular to a wafer Map display model in probe testing equipment and a method for using the same. Background technique [0002] In the probe test equipment, it is necessary to display wafer information in real time, including the distribution status of the die on the wafer, whether the wafer has trimming, the position of the die currently being tested, and the classification level of the tested die, etc. the [0003] At present, each probe test equipment manufacturer has its own wafer map display model with similar basic functions. However, these models are weak in function, poor in portability, and not flexible enough to adapt to different changes. Contents of the invention [0004] The purpose of the present invention is to provide a multi-functional wafer Map display model and its usage method in order to overcome the shortcomings in the prior art, aiming to solve...

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Problems solved by technology

[0004] The purpose of the present invention is to provide a multi-functional wafer Map display model and its usage method in order to overcome the shortcomings in the prior art, aiming to solve the problem that the existing wafer Map display model is weak in function, poor in portability and not flexible enough to adapt to different changing problems

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