Micro-displacement thickness measurement method for lithium battery film

Abstract

The invention discloses a micro-displacement thickness measurement method for a lithium battery film. The method disclosed by the invention is characterized by adopting a standard measurement block to calibrate the space between an upper sensor and a lower sensor to realize static denoising, and being combined with a joint algorithm of three-layer wavelet processing, threshold value judgment processing and seven-layer wavelet processing to realize dynamic denoising. By adopting the method, thickness measurement of any coating length of a lithium battery can be measured by the laser sensors on site in real time, and the measurement accuracy is high. The method comprises the steps of measurement in a relative stationary state as well as a relative motion state, wherein the relative motion state comprises three states that 1, a laser thickness measurement device is stationary and the lithium battery film to be measured is in motion, 2, the laser thickness measurement device is in motion and the lithium battery film to be measured is stationary and 3, the laser thickness measurement device is in motion and the lithium battery film to be measured is also in motion. The method disclosed by the invention is applicable to all the three states, so that the method has a wide application range in industry and has high adaptability.

Description

Technical field

[0001] The invention relates to the technical field of laser detection of plate thickness micro-displacement, in particular to on-line measurement of film thickness micro-displacement of arbitrary coating length. Background technique

[0002] The traditional off-line, static and contact film thickness measurement technology of lithium battery coating machine cannot meet the requirements of dynamic measurement in modern processing, such as off-line shutdown thickness measurement affects production efficiency, gamma and X-ray thickness measurement will produce radiation, ultrasonic thickness measurement will Sensitive to the external environment. Therefore, online non-contact measurement is particularly important. Due to its small size, easy integration, high measurement accuracy, low requirements for the installation environment, and no need for safety protection measures, laser thickness measurement has become the mainstream of offline static measurement. ...

Examples

Embodiment 1

[0063] The micro-displacement thickness measurement method of lithium battery film of the present invention comprises the following steps:

[0064] Step 1. Static error suppression of laser thickness measuring device:

[0065] Step 1.1, take a gauge block with a thickness of M and place it in parallel between the upper laser sensor and the lower laser sensor of the laser thickness measuring device, and measure the distance data between the upper laser sensor and the upper surface of the gauge block, which is recorded as s 1 (n), measure the distance data between the lower laser sensor and the lower surface of the gauge block, denoted as s 2 (n), record the sampling times as n, n=1,2,...N, N is the maximum sampling times;

[0066] Step 1.2, according to the formula s(n)=M+s 1 (n)+s 2 (n), to obtain the vertical spacing data between the upper laser sensor and the lower laser sensor, denoted as s(n);

[0067] Step 1.3, adopting 7-layer wavelet processing to s(n), the obtained...

Embodiment 2

[0105] In the lithium battery film micro-displacement thickness measurement method of embodiment 1, the described 7-layer wavelet processing specifically includes the following steps:

[0106] Step a, adopt 7 layers of wavelet processing to s(n), record a 0 (n)=s(n), a 0 (n) is the coefficient that wavelet decomposition has not been carried out for the low frequency band;

[0107] Step b, calculate according to the following recursive formula:

[0108] a j ( n ) = Σ k = 2 n + 1 2 n + 8 ...

Technical field

[0001] The invention relates to the technical field of laser detection of plate thickness micro-displacement, in particular to on-line measurement of film thickness micro-displacement of arbitrary coating length. Background technique

[0002] The traditional off-line, static and contact film thickness measurement technology of lithium battery coating machine cannot meet the requirements of dynamic measurement in modern processing, such as off-line shutdown thickness measurement affects production efficiency, gamma and X-ray thickness measurement will produce radiation, ultrasonic thickness measurement will Sensitive to the external environment. Therefore, online non-contact measurement is particularly important. Due to its small size, easy integration, high measurement accuracy, low requirements for the installation environment, and no need for safety protection measures, laser thickness measurement has become the mainstream of offline static measurement. ...

Examples

Embodiment 1

[0063] The micro-displacement thickness measurement method of lithium battery film of the present invention comprises the following steps:

[0064] Step 1. Static error suppression of laser thickness measuring device:

[0065] Step 1.1, take a gauge block with a thickness of M and place it in parallel between the upper laser sensor and the lower laser sensor of the laser thickness measuring device, and measure the distance data between the upper laser sensor and the upper surface of the gauge block, which is recorded as s 1 (n), measure the distance data between the lower laser sensor and the lower surface of the gauge block, denoted as s 2 (n), record the sampling times as n, n=1,2,...N, N is the maximum sampling times;

[0066] Step 1.2, according to the formula s(n)=M+s 1 (n)+s 2 (n), to obtain the vertical spacing data between the upper laser sensor and the lower laser sensor, denoted as s(n);

[0067] Step 1.3, adopting 7-layer wavelet processing to s(n), the obtained...

Embodiment 2

[0105] In the lithium battery film micro-displacement thickness measurement method of embodiment 1, the described 7-layer wavelet processing specifically includes the following steps:

[0106] Step a, adopt 7 layers of wavelet processing to s(n), record a 0 (n)=s(n), a 0 (n) is the coefficient that wavelet decomposition has not been carried out for the low frequency band;

[0107] Step b, calculate according to the following recursive formula:

[0108] a j ( n ) = Σ k = 2 n + 1 2 n + 8 ...

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