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Multi-core processor as well as testing method and device of the multi-core processor

A multi-core processor and testing device technology, applied in the field of multi-core processors, can solve problems such as complex control logic

Active Publication Date: 2013-06-12
LOONGSON TECH CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0006] The main purpose of the present invention is to provide a multi-core processor and its testing method and device, so as to solve the problem of complex control logic in the testing scheme of the multi-core processor in the prior art

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  • Multi-core processor as well as testing method and device of the multi-core processor

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Embodiment Construction

[0024] It should be noted that, in the case of no conflict, the embodiments in the present application and the features in the embodiments can be combined with each other. The present invention will be described in detail below with reference to the accompanying drawings and examples.

[0025] An embodiment of the present invention provides a test device for a multi-core processor. The test device for a multi-core processor provided by the embodiment of the present invention is described in detail below:

[0026] figure 1 is a schematic diagram of a test device for a multi-core processor according to an embodiment of the present invention, such as figure 1 As shown, the test device of the multi-core processor of the embodiment of the present invention includes a main control module 10 and a plurality of slave control modules 31 to 3n, and a plurality of slave control modules 31 to 3n are connected in series in sequence, and are respectively arranged on a plurality of processo...

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Abstract

The invention discloses a multi-core processor as well as a testing method of the multi-core processor and a testing device of the multi-core processor. The testing device of the multi-core processor comprises a main control module and a plurality of auxiliary control modules, wherein the plurality of auxiliary modules are sequentially connected in series, each processor core is provided with one auxiliary control module, and each auxiliary control module is connected with the main control module; the main control module is utilized to generate an enable signal and a main test signal, and transmits the enable signal to at least one driven control module and transmits the main test signal to an initial input end; auxiliary test signals used for testing corresponding processor cores are respectively generated by the plurality of auxiliary control modules; and the generated auxiliary test signal and a main test signal are utilized to test the corresponding processors by the at least one auxiliary control module which receives the enable signal. According to the invention, the problem that in the prior art, the control logic is more complicated in a testing scheme of the multi-core processor is solved, so that an effect of simplifying a structure of the multi-core processor is achieved.

Description

technical field [0001] The invention relates to the field of multi-core processors, in particular to a multi-core processor and a testing method and device thereof. Background technique [0002] Multi-core processors have become a development trend in the industry now, and complex and high-speed multi-core processor chips bring challenges in control, power consumption and other aspects of testing. [0003] First of all, in terms of test control, the parallel test method (that is, sending test signals to each core of the processor at the same time) faces a huge problem of interconnection of test control signals. Due to the limitation of process production, the number of I / O pins on a single multi-core processor cannot increase in the same proportion as the number of transistors integrated in this chip. Comparing two chips with process feature sizes of 180 nanometers and 35 nanometers, the increase rate of the number of transistors integrated in the chip has reached 45 times ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/317
Inventor 王琳齐子初胡伟武
Owner LOONGSON TECH CORP