Method and device for measuring phase delay spectral characteristic of wave plate
A technology of spectral characteristics and wave plate phase, which is applied in the field of polarization optical detection, can solve the problems of multiple error sources, complicated process, and inability to measure the phase delay spectral characteristics of two wave plates to be tested at the same time, so as to eliminate system errors and be easy to use Efficient effect
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[0042] The innovation of the present invention is that the self-calibration method is adopted to simultaneously realize the real-time measurement of the phase delay spectral characteristics of two unknown wave plates. Its specific implementation is as follows:
[0043] First of all, the present invention needs to build a measuring device for the phase delay spectral characteristics of the wave plate, and then achieve the purpose of the present invention through technical solutions such as self-calibration method and forward and reverse measurement method.
[0044] like figure 1 As shown, a device for measuring the phase delay spectral characteristics of a wave plate includes a broadband light source 1, and the multi-wavelength continuous light emitted by it passes through a collimator 2, a polarizer 3, a first wave plate to be measured 4, and a second wave plate in sequence. After the wave plate 5 to be measured, the polarizer 6 and the beam splitter 7, it is received by a mu...
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