The invention relates to a testing device for realizing Mueller matrix of an optical device based on a rotatable wave plate and a method. A testing
system consists of a
laser device, a polarization generator, a tested device, a polarization analyzer, a
voltage controller and a computer. Light generated by the
laser device enters the polarization generator, the polarization generator consists of a
polarizer and the rotatable wave plate, the rotation angle of the wave plate is larger than 180 degrees, rotation of the wave plate is controlled by
voltage, and the polarization generator generates different polarization state outputs under different control voltages. Light outputted by the polarization generator enters the tested device, light outputted by the tested device directly enters the polarization analyzer, and the polarization analyzer detects corresponding output polarization states of the polarization generator and corresponding
Stokes parameters of output polarization states of the tested device when in different control voltages. Afterwards, a
linear system equation among detected input and output polarization state parameters and Mueller matrix parameters of the tested device is built, the computer solves the
system equation, and then 16 parameters of the Mueller matrix can be solved.