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Wiring harness test instrument and wiring harness test method based on wiring harness test instrument

A test method and tester technology, applied in the field of wire harness testers, can solve problems such as port level interference and re-learning during circuit scanning, and achieve the effects of improving accuracy and test efficiency, improving reliability, and avoiding duplication of work.

Inactive Publication Date: 2013-08-14
NANJING GENERAL ELECTRONICS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0007] The technical problem to be solved by the present invention is to provide a wire harness tester that can quickly and accurately test the wire harness and a wire harness test method based on the wire harness tester, which effectively solves the problem of interference between port levels during circuit scanning, and The problem of needing to learn again after power failure makes the wiring harness detection cover various types of wiring harness connections. The testing method of the present invention can count the number and location of valid lines at the input and output ports of the standard line, and count the number of wrong lines at the input and output ports of the line to be tested. The number, location and error type enable maintenance personnel to perform targeted maintenance according to the error type, saving human resources and improving the accuracy of testing

Method used

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  • Wiring harness test instrument and wiring harness test method based on wiring harness test instrument
  • Wiring harness test instrument and wiring harness test method based on wiring harness test instrument
  • Wiring harness test instrument and wiring harness test method based on wiring harness test instrument

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0075] a. When the wireless beam is connected, the constant input port level value is solidified into the memory;

[0076] b. After the wiring harness is connected, set the level status of all output ports to be opposite to that of the input port, read back and record the level data of the corresponding input port;

[0077] c. Perform logical operations on the level data recorded in steps a and b bit by bit, and record the operation results;

[0078] d. The number of effective elements and the distribution position of the effective elements in the operation result of step c are the number and position of the effective lines of the input port of the standard line.

Embodiment 2

[0080] a. When the wireless beam is connected, the constant input port level value is solidified into the memory;

[0081]b. After the wiring harness is connected, set the level status of all output ports to be opposite to that of the input port, read back and record the level data of the corresponding input port;

[0082] c. Obtain the number and position distribution of the level values ​​that have changed at the input port, that is, the number and position of the effective lines of the standard line input port.

Embodiment 3

[0084] a. When the wireless harness is connected, if the input port levels are all low, perform logic "AND" operation on G[x][y] and H[x][y], if the input ports are all high level, Perform logic "OR" operation on G[x][y] and H[x][y] to get the array I1[x][y] (0<x≤X;0<y≤Y);

[0085] b. Do "XOR" operation with I1[x][y] and G[x][y] to get J1[x][y] (0

[0086] c. Do "XOR" operation with I1[x][y] and H[x][y] to get K1[x][y] (0

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Abstract

The invention discloses a wiring harness test instrument, which comprises a microcontroller unit (MCU), input equipment, a storage circuit, display equipment, an input port and an output port, wherein the input equipment, the storage circuit, the display equipment, the input port and the output port are respectively connected with the MCU, an isolation circuit is connected between the MCU and the output port, the interference problem between the port levels during the circuit scanning can be effectively solved, and the re-study problem after the power failure is solved through the storage circuit. The invention also discloses a wiring harness test method based on the wiring harness test instrument. According to the method, the number and the located positions of effective lines of the input and output ports of standard lines and the number, the located positions and the error types of lines to be tested can be obtained so that maintenance personnel can realize pointed maintenance according to the error types, human resources are saved, and the test accuracy is improved.

Description

technical field [0001] The invention relates to a wire harness tester and a wire harness test method based on the wire harness tester, which are mainly used for connector manufacturers and communication industries to test wire harnesses, and belong to the technical field of electronic detection. Background technique [0002] State Intellectual Property Office of the People's Republic of China, invention patent application number: 201110054179.5, invention name "A method and device for detecting automobile wiring harness". The circuit constitutes as figure 1 Shown: It consists of a microcomputer circuit, an address decoding circuit, M control output ports and N control output ports. The microcomputer first applies a low-level signal to the standard and the wire harness to be tested through M control output ports, and applies a high-level signal to the other standards and the wire harness to be tested, reads and stores the response matrix of the standard and the wire harness ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/02
Inventor 张宁宇
Owner NANJING GENERAL ELECTRONICS
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