Apparatus for testing elements

A technology for detecting devices and components, which is applied in the directions of measuring devices, measuring electricity, measuring electrical variables, etc., can solve the problems of difficulty in use, small number of detections, etc., and achieve the effect of easy maintenance.

Inactive Publication Date: 2013-09-11
JT
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] However, LSI has the problem that it is difficult to use an expensive detection device due to the small number of detections compared to a standard memory element detection device due to its small-quantity and multi-variety characteristics.

Method used

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  • Apparatus for testing elements
  • Apparatus for testing elements
  • Apparatus for testing elements

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0068] A component inspection device according to an embodiment of the present invention will be described below with reference to the drawings.

[0069] Such as figure 1 As shown, the component testing device according to the embodiment of the present invention may include: a loading part 100, loading a plurality of components 1; a testing part 300, testing the components 1 conveyed from the loading part 100; an unloading part 500, according to the testing part 300 test results, classify and load component 1.

[0070] The component 1 to be tested may be a memory semiconductor or a non-memory component such as a CPU (Central Processing Unit), a GPU (Graphic Processing Unit), or a system LIS (Large Scale Integration). The element 1 may be a non-memory element, in particular, an element having ball-shaped contact terminals formed on the bottom surface.

[0071] The method of transferring the component 1 between the loading unit 100 , the testing unit 300 and the unloading unit...

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PUM

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Abstract

The present invention discloses an apparatus for testing elements comprising: a loading portion on which at least one tray, on which a plurality of elements are loaded, is loaded; a loading buffer portion for receiving the elements from the tray on the loading portion through a loading transport tool, and temporarily loading the elements; a test portion for receiving the elements from the loading buffer potion and carrying out a test; an unloading buffer portion, which is positioned opposite the loading buffer portion with the test portion at the center, for receiving the elements which have undergone testing by the test portion; and an unloading portion for categorizing and loading the elements that are loaded on the unloading buffer portions by means of the unloading transport tool, depending on the result of the test carried out by the test portion; and at least one element pressing tool for transporting the elements between the loading portion, the test portion, and the unloading portion.

Description

technical field [0001] The present invention relates to a component detection device, and more specifically relates to a component detection device for detecting the electrical characteristics of a component. Background technique [0002] After the semiconductor element (hereinafter referred to as "element") has completed the packaging process, various tests such as electrical characteristics and reliability testing against heat or pressure will be performed by a semiconductor element testing device. [0003] For the detection of components, the room temperature detection performed at room temperature will be carried out according to the types of memory components; and non-memory components such as CPU (Central Processing Unit), GPU (Graphic Processing Unit), etc.; LED components; photoelectric components and other components. , Heating detection performed in a high temperature environment and many other inspections. [0004] On the other hand, as the types of IT components...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/01G01R31/28
CPCG01R31/01G01R31/2893
Inventor 柳弘俊徐龙镇金旻成柳泰植
Owner JT
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