Parallel confocal microscopy imaging method and device based on advanced sub-axisymmetric polarized light

A confocal microscopy imaging, axisymmetric polarized light technology, used in fluorescence/phosphorescence, material excitation analysis, etc., can solve the problems of low resolution and can not meet the high resolution observation of subcellular microstructures

Active Publication Date: 2016-08-10
BEIJING INFORMATION SCI & TECH UNIV
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Problems solved by technology

But in general, although these methods have improved the speed of microscopic imaging, their resolution is still low, which cannot meet the requirements of high-resolution observation of subcellular microstructures.

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  • Parallel confocal microscopy imaging method and device based on advanced sub-axisymmetric polarized light
  • Parallel confocal microscopy imaging method and device based on advanced sub-axisymmetric polarized light
  • Parallel confocal microscopy imaging method and device based on advanced sub-axisymmetric polarized light

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Embodiment Construction

[0016] Axially Symmetric Polarized Beams (ASPBs) are polarized beams with axisymmetric properties, and the axis of symmetry is the propagation axis of the beam. As shown in Figure 1(a), the polarization state of the beam at any point on the cross section (except the central point) is linearly polarized, and the polarization orientation is within the cross section. Assuming that the x-y plane is the cross-section of the beam, the z-axis represents the propagation axis of the beam, and S(r, φ) is a point on the cross-section of the beam (except the central point), its polarization orientation satisfies the following relationship,

[0017] Φ(r,φ)=P×φ+φ 0 (P≠0) (1)

[0018] Among them, P is called the polarization order, which means the cycle number of the polarization azimuth change when the beam changes 360° along the circumferential direction; φ0 is the corresponding initial polarization azimuth angle when φ=0, and its value is related to the selection of the x-axis; The pola...

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Abstract

The invention discloses a parallel confocal micro-imaging method and device based on high-polarization-order axially symmetric polarized lights. By the method, three-dimensional super resolution micro-images of an object can be obtained. The device comprises a pinhole filter, a collimating lens, a polarization converting system, a pupil filter, a beam splitting mirror, a light filter, a pinhole array plate and a sensor. A sample is placed on a three-dimensional translation platform, and the three-dimensional translation platform can move to change the detection position of a focusing light spot on the detected sample so as to realize the three-dimensional scanning imaging of the sample.

Description

technical field [0001] The invention relates to parallel confocal microscopic imaging technology, in particular to a parallel confocal microscopic imaging method and device based on advanced sub-axissymmetric polarized light. Background technique [0002] In recent years, confocal microscopy imaging technology has been widely used in the fields of micro-nano detection, precision measurement and biological science research due to its high-precision, high-resolution, non-contact and unique axial tomography capabilities, and its ability to easily realize three-dimensional image reconstruction. It has been widely used, and many large companies in developed countries in Europe and America have also launched mature products with high precision. [0003] The traditional confocal microscopic detection technology is based on the principle of three-point conjugate of the light source, the measured object point and the detector for single-point scanning imaging, so the imaging speed is...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/64
Inventor 祝连庆周哲海郭阳宽孟晓辰刘谦哲王君吴思进
Owner BEIJING INFORMATION SCI & TECH UNIV
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