A test device for half-wave short-time withstand current
A technology of short-time withstand current and test device, applied in the direction of measuring device, measuring electricity, measuring electrical variables, etc., can solve the problem of inability to control the short-time withstand current for half a wave for a specified time, and achieve the effect of simple structure
Active Publication Date: 2016-05-11
ZHEJIANG FANGYUAN ELECTRICAL EQUIP TESTING
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Problems solved by technology
Therefore, only electromechanical phase selection closing switch or circuit breaker cannot be used to control and realize the requirement of half wave (about 10ms) of short-term withstand current specified time
Method used
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[0018] The invention will be described in detail below in conjunction with the drawings: figure 1 As shown, the present invention includes an electromechanical phase selection switch A connected in series in the test circuit and controlled by the PLC control system. The electromechanical phase selection switch A is connected in series with a high-power diode D in series. The test circuit is connected with the test product E in series.
[0019] figure 1 As shown in the test circuit, the front and back circuits of the test product E connected in series are respectively connected in series with a first impedance Z for adjusting the current to the rated short-circuit capacity and a second impedance Z1 for adjusting the test current to be lower than the rated short-circuit capacity.
[0020] The first impedance Z is connected in series in the front circuit of the electromechanical phase selection switch A, and the second impedance Z1 is connected in series in the circuit behind the test ...
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A testing device of a half-wave short-time withstand current comprises an electromechanical-type phase selecting switch which is connected in a testing circuit in series, connected with a PLC control system and controlled by the PLC control system. The electromechanical-type phase selecting switch is connected in the testing circuit in series after being connected with a high-power diode in series, wherein a test object is connected in the testing circuit in series; a front circuit and a back circuit, connected in the testing circuit in series, of the test object are respectively in series connection with a first impedor and s second impedor, the first impedor adjusts the current to have rated short-circuit capacity, and the second impedor adjusts the testing current to be lower than the rated short-circuit capacity. The high-power diode is adopted for the testing device to be in series connection with the PLC control system and the phase selecting switch to be combined into the testing device of a half-wave short-time withstand current; by the utilization of the reverse cut-off time of the diode, insufficient closing and opening time of the electromechanical-type phase selecting switch is compensated, and the half-wave requirement of the short-time withstand current in appointed time can be met.
Description
Technical field [0001] The invention relates to a device for correctly controlling the half-wave time of the short-term withstand current of a low-voltage electrical product during short-term withstand current detection, and belongs to the technical field of low-voltage electrical detection. Background technique [0002] The short-time withstand current refers to the short-circuit current carried by the switching device in the closed position of the circuit within a specified time under the specified use and performance conditions. Therefore, in the short-term withstand current test, the tested product is in the closed position, and the short-circuit current and its energizing time are controlled by the short-circuit test system, that is, the short-circuit test system is responsible for controlling the closing of the short-circuit current, the specific closing time and the opening The task of short-circuit current. [0003] In domestic and foreign short-circuit testing systems, th...
Claims
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IPC IPC(8): G01R31/00
Inventor 张正王国忠黄芳陈海杰王栋林吴卫东顾忱月曹威
Owner ZHEJIANG FANGYUAN ELECTRICAL EQUIP TESTING