Optical equipment measurement method and system

Abstract

The invention discloses an optical equipment measurement method and belongs to the technical field of optical equipment measurement and microwave photonics. According to the method, on the basis of existing optical equipment measurement methods based on optical single-sideband modulation, two single-sideband detection signals (namely single-sideband detection signals including carriers and carrier suppression) are combined; accordingly, measurement errors caused by beat frequency between adjacent high-order sidebands in the optical single-sideband detection signals are eliminated, and measurement accuracy and dynamic range of the measurement system are increased greatly. The invention further discloses the optical equipment measurement system. The optical equipment measurement method and system has the advantages that optical equipment can be measured finely and accurately and the optical equipment measurement technology based on single-sideband modulation can be practical.

Description

technical field [0001] The invention relates to a method for measuring an optical device, in particular to a method for measuring an optical device using a measurement system based on optical single-sideband modulation, and belongs to the technical fields of optical device measurement and microwave photonics. Background technique [0002] With the rapid development and continuous improvement of photonic technology, high-precision optical devices need to be developed urgently. To develop high-precision optical devices, high-precision measurement technology must be supplemented. However, the existing optical device measurement technology has many problems such as low measurement accuracy and inability to realize multi-dimensional parameter measurement, which makes it impossible to make breakthroughs in the development of high-precision optical devices. In addition, existing high-precision optical devices (such as high-Q microresonators such as microrings and microspheres) cann...

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Problems solved by technology

[0004] Limited by the existing optical single sideband modulation technology, ideal optical single sideband modulation cannot be realized. There are often high-order sidebands in the optical modulation signal, which will introduce considerable measurement errors during the measurement process. The dynamic range of the measurement system will also be restricted

Although the measurement device has unparalleled measurement precision (theoretically, it can reach the same accuracy as the electric spectrum analysis technology), the existence of large measurement errors makes it difficult for this technology to be practical, and no effective solution has been reported yet.

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