Unlock instant, AI-driven research and patent intelligence for your innovation.

A non-intuitive imaging method based on optical vector patterning

An optical vector and imaging method technology, which is applied in the direction of using optical devices, material analysis by optical means, measuring devices, etc., can solve the problems of non-intuitive imaging and improve the resolution of microscopic imaging, and achieve the effect of improving the resolution.

Active Publication Date: 2016-02-03
刘学峰
View PDF9 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

There is no record of using their non-intuitive imaging to improve the resolution of microscopic imaging

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A non-intuitive imaging method based on optical vector patterning
  • A non-intuitive imaging method based on optical vector patterning
  • A non-intuitive imaging method based on optical vector patterning

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0145] Embodiment 1 Linear birefringence and polarization direction detection method

[0146] figure 2 It is a schematic diagram of the change of the vector characteristics of the light after the test sample interacts with the light according to each physical model. When δ>D, as long as the detection system has a high enough spatial sensitivity, the phase difference can be detected.

[0147] read on figure 2 , the anisotropy of matter in the light path can change the vibrational characteristics of light. For example figure 2 The propagation speeds of the two orthogonal vibration directions of the electric wave before the incident are the same, and the respective wave fronts will not be changed. Due to the effect of the sample, for example, one of these effects: linear birefringence, the phase difference between the wavefront of one polarization and the wavefront of another polarization perpendicular to it after the electric field light wave passes through the sample, tha...

Embodiment 2

[0177] Embodiment 2 Ultramicroscopic method based on linear double absorption and polarization direction: change the optical path of embodiment 1, and use the rotating polarization of the system to scan the optical path of the system to realize the linear double absorption mode, which is one of the vector features change.

[0178] The main object to be measured in this implementation case is a class of substances, such as one-dimensional photonic crystals, NaClO 3 Structural anisotropy of crystals or the like causes light absorption to vary in polarization directions and two perpendicular polarization directions of maximum and minimum absorption occur. Through the quantitative modeling measurement of the double absorption parameter, the formed double absorption parameter map can distinguish the spatial variation of the material structure, thereby improving the microscopic resolution as the above-mentioned linear birefringence modeling measurement.

[0179] The composition of th...

Embodiment 3

[0184] Embodiment 3 Ultramicroscopic method based on rotational polarization and polarization direction: change the optical path of embodiment 1, and use the rotational polarization of the system to scan the optical path of the system to realize the vector features including rotational double absorption and rotational birefringence Wait for modeling.

[0185] This vector-patterned measurement method is mainly aimed at substances composed of molecular or crystal structures with rotational symmetry, such as K 2 Cd 2 (SO 4 ) 3 , quartz crystal crystals and a large amount of foods including sugar, grease, etc., the spatial structure changes, and are used to improve and expand spatial resolution and material structure component analysis capabilities as in the above-mentioned embodiment 1.

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses an optical vector modeling based non-visual imaging method. The method comprises the following steps: establishing an optical system for measuring optical vector parameters to determine variables and realize the variable changes according o a preset optical vector modeling physical model; allowing the preset variable change of the optical system to be carried out, and recording light intensity values corresponding to the variables in the optical system and area array coordinates of the light intensity values; carrying out curve fitting of the variables obtained after the measurement and the corresponding light intensity values; and obtaining corresponding optical vector parameter values according to a fitted curve, and generating non-visual images according to the optical vector parameters and the corresponding coordinates. The method which allows the non-visual images to be generated through the measurement of the optical vector parameters effectively improves the microscopic imaging resolution and realizes the substance structure imaging.

Description

technical field [0001] The invention relates to an optical imaging method, in particular to a non-intuitive imaging method based on optical vector patterning, and belongs to the fields of optical imaging, electromechanical control, computer analysis and control software, and extensive material structure and shape feature analysis and processing. Background technique [0002] The microstructure of matter, including the spatial sequence of atomic arrangement inside matter, is often analyzed by X-rays, electron beam diffraction and various electromagnetic wave spectra. However, on the one hand, the high energy of X-rays and electron beams often changes the structure of some substances such as living organisms and other organic structures, causing damage. Stress-induced changes in the characteristic structure, etc. are powerless. Spectral analysis is generally only effective for short-range sequences and invalid for long-range sequences such as crystal plane alignment, and the ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/00G01B11/24
Inventor 刘学峰
Owner 刘学峰