Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

A solar silicon wafer sorting system and method based on photoluminescence

A technology of solar silicon wafers and photoluminescence, applied in sorting, single semiconductor device testing, etc., can solve the problems of not knowing the efficiency or inefficiency of silicon wafers, the inability to sort, grade, and inefficient silicon wafers, and achieve improved The effect of comprehensive product performance, improvement of ingot casting process and improvement of yield rate

Active Publication Date: 2016-05-11
KONCA SOLAR CELL
View PDF5 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] For a long time, people have not made much breakthrough in polysilicon detection technology. During the production process of silicon wafers, it is not possible to sort and grade silicon wafers. It is not known whether silicon wafers are efficient or inefficient.
The potential conversion efficiency of solar cells made of silicon wafers is closely related to the quality of silicon wafers. Before the production of silicon wafers, only passing performance tests such as the existing appearance and minority carrier life cannot accurately reflect the potential performance of the silicon wafers. The electrical performance parameters of solar cells, resulting in poor electrical performance of the battery caused by low-efficiency silicon wafer sources

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A solar silicon wafer sorting system and method based on photoluminescence
  • A solar silicon wafer sorting system and method based on photoluminescence

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0021] The present invention will be further described below in conjunction with drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, but not to limit the present invention. In addition, it should be noted that, for the convenience of description, only parts related to the present invention are shown in the drawings but not all content.

[0022] Please refer to figure 1 as shown, figure 1 A block diagram of a solar silicon wafer sorting system based on photoluminescence provided by an embodiment of the present invention.

[0023] The solar wafer sorting system based on photoluminescence in this embodiment specifically includes a laser emitting device 101 , a data acquisition device 102 and a host computer 103 .

[0024] The laser emitting device 101 is electrically connected with the host computer 103, and is used for irradiating laser light to the surface of the silicon wafer to be so...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a solar silicon wafer sorting system and a solar silicon wafer sorting method based on photoluminescence. The system comprises a laser emitting device, a data acquisition device and a host computer, wherein the laser emitting device is electrically connected with the host computer and used for irradiating laser on the surface of a to-be-sorted silicon wafer, the data acquisition device is electrically connected with the host computer and used for acquiring fluorescence signals fed back by the to-be-sorted silicon wafer, and the host computer is used for analyzing the fluorescence signals, acquiring dislocation density information and impurity content information of the to-be-sorted silicon wafer, determining the grade of the silicon wafer and analyzing insufficiency in polycrystalline silicon ingot casting according to changes of dislocation density and impurity content of the silicon wafer during polycrystalline silicon ingot casting. With the system and the method provided by the invention, silicon wafers with different performances can be effectively sorted, low efficiency silicon wafers with high dislocation density or high impurity content can be removed, so influence of the low efficiency silicon wafers on transfer efficiency of a whole battery is prevented; meanwhile, adverse conditions in polycrystalline silicon ingot casting can be analyzed, and process optimization can be carried out on polycrystalline silicon ingot casting.

Description

technical field [0001] The invention relates to the technical field of polysilicon detection, in particular to a solar silicon wafer sorting system and method based on photoluminescence. Background technique [0002] For a long time, people have not made much breakthrough in polysilicon detection technology. During the production process of silicon wafers, it is not possible to sort and grade silicon wafers, and it is not known whether silicon wafers are efficient or inefficient. The potential conversion efficiency of solar cells made of silicon wafers is closely related to the quality of silicon wafers. Before the production of silicon wafers, only passing performance tests such as the existing appearance and minority carrier life cannot accurately reflect the potential performance of the silicon wafers. The electrical performance parameters of solar cells, resulting in poor electrical performance of the battery caused by low-efficiency silicon wafer sources. Contents of ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): B07C5/34B07C5/36G01R31/26
Inventor 张爱平王欣
Owner KONCA SOLAR CELL
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products