Circuit yield estimation method based on CAD (computer aided design) Monte Carlo analysis

A Monte Carlo analysis and circuit yield technology, applied in computing, electrical digital data processing, special data processing applications, etc., can solve the problems affecting circuit yield analysis, large errors, and high simulation costs

Active Publication Date: 2014-02-05
XIDIAN UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0016] The invention provides a circuit Monte Carlo analysis method based on computer-aided design, aiming to solve the traditional circuit Monte Carlo analysis based on actual circuit simulation, the number of circuit simulations is large, and the simulation cost is high. The circuit is becoming more an...

Method used

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  • Circuit yield estimation method based on CAD (computer aided design) Monte Carlo analysis
  • Circuit yield estimation method based on CAD (computer aided design) Monte Carlo analysis
  • Circuit yield estimation method based on CAD (computer aided design) Monte Carlo analysis

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0093] Example 1 Estimation of RF Amplifier Circuit Yield Rate Based on Monte Carlo Analysis

[0094] This example is for a radio frequency amplifier circuit (circuit schematic diagram as figure 2 Shown) to estimate the yield, step 1: determine the circuit design indicators, key component parameters and their distribution:

[0095] The main design indicators of the circuit are shown in Table 1:

[0096] Table 1 Requirements for RF amplifier circuit performance design indicators

[0097] Indicator name

[0098] After the analysis of the circuit principle and the sensitivity analysis of the circuit component parameters, it is determined that the components that have a significant impact on the gain and bandwidth include 5 resistors. The component names, nominal values ​​and standard deviations are shown in Table 2:

[0099] Table 2 Monte Carlo analysis components and their distribution rules of RF amplifier circuit

[0100] Component name

[0101] Under a...

Embodiment 2

[0134] Embodiment 2 Monte Carlo Analysis Example of Bandgap Reference Source Circuit

[0135] In this example, a Monte Carlo analysis is performed on the yield rate of the bandgap reference source. The circuit diagram is as follows Figure 5 As shown, all components in the circuit come from TSMC's 0.5μm CMOS process library. The structure of the test program in this example still uses JMP7.0 of SAS Company, and the circuit simulation software uses HSpiceE-2010.12 of Synopsys Company.

[0136] Step 1: Determine circuit design indicators, key component parameters and their distribution:

[0137] The main design specifications of the circuit are shown in Table 10.

[0138] Table 10 RF amplifier circuit performance index requirements

[0139] Indicator name

Indicator requirements

Voltage Rejection Ratio (PSRR)

[76.5,+∞)

Temperature Coefficient (TC)

[0,152)

[0140] Taking the width W of transistors M1~M8 as the test factor, it can be s...

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Abstract

The invention discloses a circuit yield estimation method based on CAD Monte Carlo analysis. The method comprises steps as follows: a topological structure of an analyzed electronic circuit or integrated circuit, a performance parameter index range of the circuit and statistical distribution laws of a key element parameter and an element parameter are determined; an agent model between a circuit performance parameter and an element parameter nominal value is established for approximating a circuit; a random sampling combination sequence of circuit Monte Carlo analysis is generated according to the circuit element parameter distribution laws; the agent model of the circuit performance parameter is used for predicating the random sampling combination sequence, and circuit performance parameter predicted values and a confidence interval range of each performance parameter predicted value are obtained; the circuit performance parameter predicted values are modified and calculated; and the performance parameter predicted values are substituted into the a performance parameter index standard range for statistical analysis, and the yield of the circuit performance parameter is calculated. According to the method, the time cost is low, the circuit simulation times are few, the analysis efficiency is high, and the accuracy for estimating the yield is high.

Description

technical field [0001] The invention belongs to the technical field of computer-aided design of electronic circuits and integrated circuits, and in particular relates to a circuit yield estimation method based on Monte Carlo analysis of computer-aided design (CAD). Background technique [0002] Due to the manufacturing process and service conditions, the components in any electronic circuit will inevitably be affected by random disturbance factors, so that there will be random errors between the parameters of the components in the actual circuit and the design target values, resulting in The actual value of the component parameter is not necessarily equal to its nominal value, but just a random value within the tolerance range of its nominal value. In the actual electronic circuit design process, the nominal values ​​of component parameters are often used for analysis and design, so there must be differences between the designed circuit and the actual circuit performance. I...

Claims

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Application Information

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IPC IPC(8): G06F17/50
Inventor 游海龙贾新章顾铠张潇哲
Owner XIDIAN UNIV
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