Device and corresponding method for measuring optical rotation of transparent film with periodic chiral structure

A technology of chiral structure and transparent thin film, applied in the direction of polarization influence characteristics, etc., can solve the problems of small structure size, difficulty in measuring optical rotation angle, etc., and achieve the effect of simple measurement process and accurate measurement results

Inactive Publication Date: 2014-02-26
NINGBO UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, the current existing devices and methods for measuring optical rotation often require the measured object to have a fixed size, and also have certain requirements for the size of the transmitted light spot
Due to the th

Method used

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  • Device and corresponding method for measuring optical rotation of transparent film with periodic chiral structure
  • Device and corresponding method for measuring optical rotation of transparent film with periodic chiral structure
  • Device and corresponding method for measuring optical rotation of transparent film with periodic chiral structure

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Example Embodiment

[0023] Example one:

[0024] The invention provides a device for measuring the optical rotation of a transparent film with a periodic chiral structure, and its composition structure is as figure 1 As shown, it includes a measuring light source 1, a polarizer 2, an aperture 3, an analyzer 7 and a fiber spectrometer 8. The polarizer 2, the aperture 3 and the analyzer 7 are sequentially arranged in the measuring light source 1 to emit In the light propagation path of the light beam, the polarizer 2 is connected with a stepping motor 10 for driving the polarizer 2 to rotate, and a position-adjustable sample stage is set between the diaphragm 3 and the analyzer 7, which transmits through The light beam of the diaphragm 3 is irradiated vertically on the transparent film of the periodic chiral structure fixed on the sample stage. The probe of the fiber optic spectrometer 8 detects the light intensity of the light beam passing through the analyzer 7, and the output end of the fiber optic ...

Example Embodiment

[0027] Embodiment two:

[0028] This embodiment is the corresponding method of the apparatus for measuring the optical rotation of a periodic chiral structure transparent film proposed in the first embodiment, which includes the following steps:

[0029] ①Turn on the measurement light source 1, then adjust the polarization direction of the polarizer 2 and the polarization direction of the analyzer 7 to be orthogonal, and then fix the periodic chiral structure transparent film to be measured on the sample stage, and make the The measured transparent film with periodic chiral structure is perpendicular to the light propagation path of the light beam emitted by the measuring light source 1.

[0030] Then, adjust the position of the sample stage so that the light beam passing through the aperture 3 irradiates vertically on the transparent film of the periodic chiral structure to be measured; and adjust the aperture 3 so that the light beam passing through the aperture irradiates vertical...

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Abstract

The invention discloses a device and corresponding method for measuring optical rotation of a transparent film with a periodic chiral structure. The device comprises a measurement light source, a polarizer, a diaphragm and a polarization analyzer, and an optical fiber spectrometer, wherein the polarizer, the diaphragm and the polarization analyzer are sequentially arranged on an optical propagation path of a light beam emitted by the measurement light source, wherein the polarization analyzer is connected with a step motor used for driving the polarization analyzer to rotate, a sample platform with an adjustable position is arranged between the diaphragm and the polarization analyzer, a probe of the optical fiber spectrometer detects light intensity of the light beam passing through the polarization analyzer, and a computer terminal used for displaying a spectrum chart is connected to the output end of the optical fiber spectrometer. The device has the advantages that the optical fiber spectrometer is capable of accurately and rapidly testing the light intensity in real time, the light intensity change caused by the rotation of the polarization analyzer driven by the step motor is accurately observed on the computer terminal, when the light intensity is minimum, the angle of the rotation of the polarization analyzer, driven by the step motor, is the optical rotation of the transparent film with the periodic chiral structure, the measurement process of the optical rotation is simple, and the measurement result is accurate.

Description

technical field [0001] The invention relates to an optical rotation measurement technology, in particular to a device and a corresponding method for measuring the optical rotation of a transparent film with a periodic chiral structure. Background technique [0002] Controlling the polarization (polarization) state of light often plays a vital role in current production, life and scientific research. To effectively control the polarization of light, it is essential to obtain a large degree of optical rotation (that is, the angle of optical rotation). The chiral structure can rotate the polarization plane of the electromagnetic wave passing through it. Typical natural chiral structures include amino acid solutions, quartz crystals, etc.; artificially arranged chiral structures (that is, periodic chiral structures) have great Optical rotation, especially a very thin periodic chiral structure can rotate the polarization plane of light at a large angle, and its optical rotation ...

Claims

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Application Information

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IPC IPC(8): G01N21/21
Inventor 刘道亚董建峰刘锦景陶卫东潘雪丰张斌何如双
Owner NINGBO UNIV
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