Dual-light source specular reflection surface measurement system

A specular reflection and surface measurement technology, which is applied in the direction of measuring devices, optical devices, and material analysis through optical means, can solve problems such as complex algorithms, incompleteness, and increased complexity, so as to avoid mutual occlusion and remove speed bottlenecks , high display density effect

Inactive Publication Date: 2014-03-12
GUANGZHOU HKUST FOK YING TUNG RES INST
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] In order to avoid the occlusion of the light source in the measurement system using dual light sources, the existing technology needs to use mechanical equipment to move the light source, so the measurement speed is limited by the moving speed of the mechanical equipment
Compared with other parts of the measurement system, the moving speed of the mechanical system is very slow, which becomes a speed bottleneck; the measurement system using dual cameras has a large number of search processes, which increases the complexity; the method of using additional information is theoretically not complete. Algorithms are complex and therefore not suitable for industrial production processes

Method used

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  • Dual-light source specular reflection surface measurement system
  • Dual-light source specular reflection surface measurement system
  • Dual-light source specular reflection surface measurement system

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Embodiment Construction

[0016] refer to Figure 1 ~ Figure 3 , the present invention provides a dual light source specular reflective surface measurement system, including a first point light source array 1 and a camera 3 that records the light emitted by the first point light source array 1 and reflected by the object to be measured 2, the first point light source A beam splitter 4 is provided between the array 1 and the object to be tested 2, and a second point light source array 5 is provided on one side of the beam splitter 4, and the light from the second point light source array 5 is reflected by the beam splitter 4 and the object to be tested 2 in turn, and then put into the camera3.

[0017] The working principle of the dual light source specular reflection surface measurement system is as follows:

[0018] When the second point light source array 5 is turned on and the first point light source array 1 is turned off, since the light splitter 4 has the ability of refraction (equivalent to tra...

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Abstract

The invention discloses a dual-light source specular reflection surface measurement system which comprises a first point light source array and a camera used for recording a light ray which is emitted by the first point light source array and reflected by an object to be tested, wherein a light splitter is arranged between the first point light source array and the object to be tested, a second point light source array is arranged at one side of the light splitter, a light array of the second point light source array is projected into a video camera after being reflected by the light splitter and the object to be tested. A key part of the dual-light source specular reflection surface measurement system is the light splitter, through using the light splitter, mutual shielding between light sources can be avoided when a dual-light source positioning method is used, and thus no mechanical device movable light source is needed, and the speed bottleneck caused by a mechanical device is removed. In addition, two light sources adopt point light source arrays, which can achieve very high display density, and thus higher measurement precision can be achieved for a normal vector of the surface of the object to be tested. The dual-light source specular reflection surface measurement system is simple in structure, and can be widely applied to the field of automatic measurement of mirror surface reflection.

Description

technical field [0001] The invention is used in the field of object surface measurement, and in particular relates to a mirror reflection surface measurement system. Background technique [0002] Products with specular reflective surfaces are often produced in industrial production, such as smooth plastic surface, polished metal and injection molded / polished optical lenses, etc. For some of these products, precise measurement of the surface is required, for example, the smoothness of the decorative surface needs to be measured, and the surface curvature of the aspheric lens needs to be measured. The traditional three-dimensional measurement method is not suitable for such specular reflective surfaces because it requires the object to be measured to be a diffuse reflective surface. [0003] For specular reflective surfaces, the common measurement method is manual measurement. One is to observe components with high surface finish, such as decorative surfaces, with the naked ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/84G01B11/00
Inventor 徐彬高福荣姚科
Owner GUANGZHOU HKUST FOK YING TUNG RES INST
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