Method for 3-D SAR wavenumber domain fast imaging

A fast technology in the wavenumber domain, applied in the reflection/re-radiation of radio waves, radio wave measurement systems, and the use of re-radiation. The effect of proliferating, fast imaging processing

Active Publication Date: 2014-03-12
INST OF ELECTRONICS CHINESE ACAD OF SCI
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Problems solved by technology

Since the higher-order items of the third and higher orders in the distance history are ignored, the three-dimensional observation area scene cannot be accurately reconstructed, especially when the distance from the radar to the observation area is short and the survey area of ​​the observation area is large, the approximation of the distance history resulting in a larger reconstruction error
[0003] The three-dimensional wavenumber domain method can fully compensate the distance migration in the scene, and the reconstruction accuracy is high, but this type of method requires that the synthetic aperture length is not less than the imaging area when collecting echoes to prevent FFT from wrapping. In SAR, the length of the cross-course array antenna is generally several meters, and the cross-course width is several hundred meters to several thousand meters. Therefore, a large amount of zero padding is required for the echo data, which will bring a surge in memory requirements and calculations.
If the three-dimensional wavenumber domain method is directly used to reconstruct the scene of the entire observation area, both the amount of data and the amount of calculation are very large, which limits the application of this method in the airborne downward-looking array 3-D SAR

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[0022] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be described in further detail below in conjunction with specific embodiments and with reference to the accompanying drawings. It should be noted that, in the drawings or descriptions of the specification, similar or identical parts all use the same figure numbers. Implementations not shown or described in the accompanying drawings are forms known to those of ordinary skill in the art.

[0023] The 3D SAR wave number domain rapid imaging method of the present invention is suitable for imaging modes such as airborne down-looking array 3-D SAR and multi-baseline 3-D SAR, and the length of the cross-course aperture is much smaller than the cross-course width (L e / [2H sin(θ e / 2)]≤0.01, L e is the length of the cross-course aperture, generally a few meters; 2H sin(θ e / 2) is the cross-course width, generally in the order of kilometers, where H is t...

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Abstract

The invention provides a method for 3-D SAR wavenumber domain fast imaging. The method just reestablishes area of interest but not a whole three-dimensional observation area scene, thereby preventing sharp increase of data size, and fast imaging process can be performed.

Description

technical field [0001] The invention relates to the technical field of radar imaging and signal processing, in particular to a 3-D SAR under the condition that the length of the cross-course aperture is much smaller than the cross-course surveying and mapping bandwidth in the airborne downward-looking array 3-DSAR and multi-baseline 3-D SAR working modes A method for fast imaging in the wavenumber domain. Background technique [0002] Airborne array down-looking 3-D SAR and multi-baseline 3-D SAR can obtain the three-dimensional scattering information of the scene in the observation area, and can overcome the problems of shadows and overlapping in conventional side-looking SAR, so they have broad application prospects. At present, the 3-D SAR imaging processing mainly uses RD, CS, ω-k and other methods in the conventional side-looking SAR imaging processing methods in the wave propagation direction and track direction, and then uses SPECAN, beamforming, methods such as comp...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01S13/90
CPCG01S7/2927G01S13/90G01S13/9011
Inventor 王彦平彭学明谭维贤洪文吴一戎
Owner INST OF ELECTRONICS CHINESE ACAD OF SCI
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