Four-point resistor testing device

Abstract

The invention discloses a four-point resistor testing device. The four-point resistor testing device comprises a resistance testing probe assembly and a sample bench assembly which are movably connected through a tubular clamp; the resistance testing probe assembly is provided with resistance testing probes; the sample bench assembly is provided with a sample bench; and the resistance testing probes abut tight against the upper surface of the sample bench under effects of the bite force of the tubular clamp. The resistance testing of the four-point resistor testing device is contact type testing, and a silver slurry bonding mode in a conventional four-point resistor testing method is avoided, so that on one hand, a sample to be detected is not polluted, and the sample to be detected can be continuously used or subjected to secondary testing; and on the other hand, the problem of incapability of accurate control of the positions of the four probes due to silver slurry bonding is avoided, and the measuring precision is improved. At the same time, the measuring temperature is not restricted by an oxidation temperature of silver slurry anymore, and theoretically, the testing temperature can reach the melting point of a platinum wire, i.e., 1680 DEG.

Description

technical field [0001] The invention belongs to the technical field of material testing, and in particular relates to a four-probe resistance testing device. Background technique [0002] It is a difficult point to accurately, conveniently, quickly and intelligently test the resistance value of materials that change with temperature changes in a large temperature range. The difficulty lies in: [0003] 1) To accurately test the resistance of the material, it is best to use the standard four-probe form. The material used for the four-probe at high temperature is very demanding, and it is resistant to high temperature and oxidation; [0004] 2) The test must be carried out in a corundum tube in a tube furnace with an inner diameter of only about 35mm, and the space is narrow, which makes it difficult to design and manufacture the test device; [0005] 3) The temperature instrument of the tube furnace itself cannot accurately reflect the temperature of the sample, and a temper...

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Problems solved by technology

[0004] 2) The test must be carried out in a corundum tube in a tube furnace with an inner diameter of only about 35mm, and the space is narrow, which makes it difficult to design and manufacture the test device;

[0005] 3) The temperature instrument of the tube furnace itself cannot accurately reflect the temperature of the sample, and a temperature measuring device that can accurately reflect the temperature of the sample must be provided

The disadvantage of this method is that: on the one hand, the conductive silver paste is easy to oxidize at high temperature, resulting in poor contact between the probe and the sample and some interface problems, and the silver paste is easy to diffuse with the sample under high temperature conditions, pollute the sample, and cannot be tested again ; On the other hand, the method of silver paste welding determines that the distance between the four probes cannot be accurately controlled, and each sample must be welded, the measurement error increases and the test is complicated. Therefore, this method tests the effect at high temperature Not so good

[0007] In the current test method, a thermocouple is usually placed next to the sample to be tested to measure the test temperature, or the temperature value of the tube furnace is directly recorded as the temperature value of the sample to be tested. These methods cannot achieve Accurate measurement of the temperature of the sample to be tested

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