VDMOS component low-temperature long-distance on-line test system

Abstract

The invention provides a VDMOS component low-temperature long-distance on-line test method which includes the following steps that hardware equipment is connected for debugging to guarantee that a whole experiment system operates well; a computer is controlled to operate a test program and a control instruction is output to a test development board; the instruction is received by the test development board, and a single chip microcomputer switches on a switch according to the instruction; according to the switched-on switch, a corresponding component on the development board of a to-be-tested component is selected; the selected component is tested through test equipment, and test data are fed back to the control computer; the control computer receives the test data of the test equipment and displays and stores the test data. The invention further provides a VDMOS component low-temperature long-distance on-line test system. The defects that according to a common experiment, the number of tests is small and consumed time is long are overcome, meanwhile, influences of water vapor on the surface of the tested component on an instrument are avoided, and the test method is easy and quick to achieve.

Description

technical field [0001] The invention relates to the technical field of semiconductor experiment testing, in particular to an online device testing system for power VDMOS devices in a low-temperature environment. Background technique [0002] The power VDMOS device (Vertical Double-diffused Metal Oxide Semiconductor) is a vertically conductive double-diffused power device, which has the characteristics of high input impedance, low driving power, fast switching speed, and good thermal stability. It also has a negative temperature coefficient. There is no so-called secondary breakdown of bipolar transistors. These advantages make VDMOS devices have good application prospects in extremely complex environments such as aerospace, military, and nuclear applications. [0003] Compared with the ground, power VDMOS devices must ensure high reliability when they are used in special fields such as aerospace, military, and nuclear energy. In order to ensure that the device can work stab...

AI Technical Summary

Problems solved by technology

When the displacement test is carried out from the low temperature box to the test bench, due to the change of the ambient temperature, it is required to complete the test task in a very short time (1 minute), and the test equipment can only test one device at a time, which directly Resulting in a low number of products per test

At the same time, every time the device is taken and placed, the opening of the low-temperature box door makes the air at room temperature flow into the box, causing the temperature in the box to rise, so that it takes a while for the temperature in the low-temperature box to drop to the required low temperature after each device is placed. time, which not only affects our test time, but also is cumbersome; in addition, the test is carried out in a room temperature environment, and the test head of the test equipment is in direct contact with the device pins, and in the process from low temperature to room temperature, due to the ambient temperature The change of the device shows that there is water vapor, and the long-term test will cause harm to the test head of the test instrument

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