Pin hole flaw detection system for isolated film and detection method thereof
A defect detection and isolation film technology, applied in the direction of optical test defects/defects, etc., can solve problems such as difficulty in distinguishing pinhole defects and colloidal defects, and achieve the effect of avoiding explosion and reducing the probability of false detection.
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[0022] In order to have a further understanding of the purpose, structure, features, and functions of the present invention, the following detailed descriptions are provided in conjunction with the embodiments.
[0023] Please refer to figure 2 , figure 2 It is a schematic diagram of a pinhole defect detection system 200 for an isolation film according to an embodiment of the present invention. The detection system 200 includes a light source 21 , a first polarizer component 22 , a second polarizer component 24 , an optical camera device 25 and a control module 26 . The optical camera device 25 is used to capture the detection image of the detection area corresponding to the point to be measured on the isolation film 23 to be detected that includes the point to be tested; the light source 21 provides light that travels toward the optical camera device 25; the first polarizing assembly 22 has a second An optical axis, which can be a polarizer or a metal grating, is located ...
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