A test equipment protection circuit

Abstract

The invention provides a test equipment protection circuit, which solves the technical problems that the current test equipment and tested equipment lack effective protection measures and the like. The test equipment protection circuit comprises a management and control circuit, a hot plug protection circuit and an ID acquisition circuit, wherein a power supply of the equipment is connected with an adapter through the hot plug protection circuit, or the power supply of the equipment is directly connected with a tested module through the hot plug protection circuit under the condition of no adapter; the management and control circuit comprises a clamping circuit, a comparison circuit, a decoding circuit, a gate circuit assembly, a trigger circuit and a counting / timing circuit; an output end of the counting / timing circuit is divided into multiple signals which are respectively used as a corresponding switch control signal, a feedback protection signal and a driver / buffer / isolator control signal. The test equipment protection circuit can shield adverse effects of extreme work conditions on the test equipment in real time, so that the test equipment can well bear the extreme conditions.

Description

technical field

[0001] The invention relates to a test equipment protection circuit, which is used to protect the equipment itself, the adapter (TUA, Test Unit Adapter, ITA, Interface Test Adapter) and the module under test during the working process of automatic test equipment (ATE, Automatic Test Equipment) or other test equipment (UUT, Unit Under Test) for protection. Background technique

[0002] Test equipment is the core component of mass production lines, and its price is generally more expensive. Protection of equipment and UUTs is often overlooked during test system design. At present, most test equipment can only perform simple overcurrent and overvoltage protection during work, and some even have no protection at all. But modern test equipment often needs to face the challenge of harsh conditions, which often come from users, UUT and the external environment. Test equipment often works under overvoltage, overcurrent and high temperature conditions. These extre...

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