Analogue circuit fault diagnosis method based on improved type clone selection algorithm
A clone selection algorithm and a technology for simulating circuit failures, applied in the direction of genetic models, etc., can solve problems such as the difficulty of determining the size of the judgment radius, the increase in the size of the clone and the amount of calculation, and the uncertainty of high-frequency mutations, so as to reduce multi-point, Avoid calculation overflow, comparable effect
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[0040] The present invention will be described in detail below with reference to the accompanying drawings and examples.
[0041] Step 1, training sample extraction;
[0042] Let the analog circuit under test be in various states; in each state, from the eigenvalues extracted from the M nodes of the analog circuit under test, each node extracts n types of eigenvalues; then the n types of eigenvalues of a node Constitute an individual, expressed as A={a 1 , a 2 ,...,a n}, M individuals form a training sample; each state extracts training samples multiple times.
[0043] The extraction of eigenvalues is the basis of recognition learning, and the types of eigenvalues include fault characteristics of typical circuits and fault characteristics extracted based on artificial intelligence technology such as wavelet analysis.
[0044] Among them, the fault characteristics of a typical circuit are the characteristics summed up by engineers based on experience and known to re...
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