Material surface defect detection method based on compressed sensing

Abstract

The invention discloses a material surface defect detection method based on compressed sensing. The method comprises the following steps: first, a to-be-detected material surface low-resolution image acquisition model is established; then, super-resolution reconstruction is carried out on a material surface image, a Haar wavelet is adopted as the basis function of a representation function, and transform basis matrix design is carried out on the basis function by the use of discrete cosine transform and discrete wavelet transform; next, during super-resolution reconstruction of the material surface image, an orthogonal matching pursuit algorithm is adopted to orthogonalize a selected bionic cell in the iterative process to enable the reconstruction process to be converged in finite steps; and finally, macro block processing is introduced to complete reconstruction of the to-be-detected material surface image. Based on the principle of compressed sensing, super-resolution reconstruction is carried out by the use of a general sparse transform domain, and target recognition and detection are achieved on the basis.

Description

technical field [0001] The invention proposes a material surface defect detection method based on compressed sensing, belonging to the fields of electronic measurement and control and machine vision. Background technique [0002] In recent years, Chinese scientist T.Tao, American Academy of Sciences academician D.Donoho, Ridgelet and Curvelet founder E.Candes and a group of outstanding scientists have proposed based on research in signal processing, wavelet analysis, calculation, statistics and other related fields. Compressed sensing (Compressed Sensing, CS) theory, which proposes a new information acquisition mode: sparse or sparse high-dimensional data can be approximated by a small number of linear non-adaptive projections on the collected perception vectors, that is, in data acquisition The compressed version can be obtained directly during the process. [0003] Many universities represented by Rice, Duke and MIT have laid many theoretical foundations in the field of c...

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Problems solved by technology

[0005] In order to solve the problem that in the high-resolution reconstruction of the existing material surface defect detection system, there is a lack of prior information, and it is impos...

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