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Semiconductor element and method for manufacturing semiconductor element

A manufacturing method, semiconductor technology, applied in the direction of semiconductor/solid-state device manufacturing, semiconductor devices, semiconductor/solid-state device components, etc., can solve problems such as difficulties, achieve efficient manufacturing, suppress mutual diffusion, and suppress the effect of increasing interface resistance

Inactive Publication Date: 2014-04-16
KOBE STEEL LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Therefore, in the case of using the above method, it is necessary to precisely control the thickness of the nitride layer to a well-balanced thickness, which is very difficult in reality

Method used

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  • Semiconductor element and method for manufacturing semiconductor element
  • Semiconductor element and method for manufacturing semiconductor element
  • Semiconductor element and method for manufacturing semiconductor element

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Experimental program
Comparison scheme
Effect test

Embodiment 1

[0082] On the surface of the single crystal silicon substrate (plane direction 100 ) serving as the semiconductor region, an aluminum alloy film containing 0.5 atomic % of germanium was formed by magnetron sputtering. Next, heat treatment was performed at 500° C. for 20 minutes in an atmosphere of an inert gas (N 2 ). In this way, a diffusion prevention layer was formed between the silicon substrate (semiconductor region) and the aluminum alloy film (electrode), and the semiconductor element of Example 1 was obtained.

[0083] The content and film thickness of each component in the diffusion prevention layer of the obtained semiconductor element were measured by the method described above. Table 1 shows the content of each component. in addition, figure 2 A cross-sectional TEM image of the obtained semiconductor element is shown in . Furthermore, the "dots" in Table 1 indicate figure 2 position of the arrow. In addition, the film thickness was 3.0 nm.

[0084] Table 1 ...

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PUM

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Abstract

Provided is a semiconductor element in which atomic interdiffusion between a semiconductor region and an electrode is suppressed and increase in the interface resistance is suppressed even in cases where the semiconductor element is exposed to high temperatures during the production processes or the like. A semiconductor element of the present invention is provided with: a semiconductor region that contains silicon; an electrode that contains aluminum; and a diffusion preventing layer that is interposed between the semiconductor region and the electrode and contains germanium. The germanium content in at least a part of the diffusion preventing layer is 4 at% or more.

Description

technical field [0001] The present invention relates to a semiconductor element and a method for manufacturing the semiconductor element. Background technique [0002] In recent years, insulated-gate (MOS) type semiconductor devices are becoming popular as power devices for controlling large electric power. As said MOS type semiconductor device, an IGBT (insulated gate bipolar transistor), a power MOSFET (power MOS field effect transistor), etc. are mentioned, for example. [0003] As the above-mentioned MOS type semiconductor device, the following reference figure 1 The general structure of a typical IGBT will be described. figure 1 The IGBT1 has: a p-type collector layer 2, an n-type base layer 3 formed on the surface of the collector layer 2, a p-type body region 4 separately formed on the surface of the base layer 3, and each of the body regions An n-type emitter layer 5 is formed on the surface of the region 4. The collector layer 2, the base layer 3, the body regio...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L21/28
CPCH01L21/2855H01L29/7395H01L21/28525H01L29/456H01L21/76841H01L23/53223H01L21/76867H01L21/28556H01L29/401H01L2924/0002H01L29/7802H01L29/161H01L29/165H01L2924/00
Inventor 前田刚彰奥野博行横田嘉宏
Owner KOBE STEEL LTD