Imaging system of atomic force microscope on the basis of quartz tuning fork probe
An atomic force microscope and quartz tuning fork technology, applied in the field of experimental instruments, can solve the problems that it is difficult for students to quickly understand the working principle of the atomic force microscope, the high cost of the experiment, and the complicated operation of the instrument, so as to reduce the teaching cost, large scanning range and small size Effect
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[0046] The present invention will be further described in detail below in conjunction with the accompanying drawings.
[0047] The imaging system of the atomic force microscope based on the quartz tuning fork probe designed by the present invention is a teaching instrument designed to allow students to master the basic principles and applications of the atomic force microscope, improve the students' hands-on ability in experiments, and enhance the experimental effect. By actually operating the imaging system of the atomic force microscope based on the quartz tuning fork probe designed by the present invention, the students can scan and obtain the surface topography map of the sample 4A on the sample stage 4 . The atomic force microscope plays an important role in characterizing the surface structure and properties of substances, and it will be of great help to students in their future research and study through this experiment.
[0048] see figure 2 Shown, the present invent...
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