Imaging system of atomic force microscope on the basis of quartz tuning fork probe

An atomic force microscope and quartz tuning fork technology, applied in the field of experimental instruments, can solve the problems that it is difficult for students to quickly understand the working principle of the atomic force microscope, the high cost of the experiment, and the complicated operation of the instrument, so as to reduce the teaching cost, large scanning range and small size Effect
CN103808967AInactive Publication Date: 2014-05-21BEIHANG UNIV
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
BEIHANG UNIV
Publication Date
2014-05-21
Estimated Expiration
Not applicable · inactive patent

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Abstract

The invention discloses an imaging system of an atomic force microscope (AFM) on the basis of a quartz tuning fork probe. An AFM controller in the system is respectively connected with a graphic display, a piezoelectric ceramic tube scanner, a drive circuit of a stepping motor, a feedback signal detection circuit and a scanning control signal processing circuit through wire cables so as to achieve transmission of electrical signals, a probe limiting seat is installed on a sample table, a round mounting table is mounted above the probe limiting seat, and the piezoelectric ceramic tube scanner, a displacement adjusting component and a circuit mounting box which is supported by four supporting columns are installed on the round mounting table. By means of the imaging system of the AFM on the basis of the quartz tuning fork probe, a student can know basic working principles of the AFM and operating steps of the imaging system, and the imaging system can be used for observing a microstructure of a sample. During an experiment, the student can measure force sensor--quartz tuning fork probe damping coefficient of the imaging system and observe bistable state phenomena to further understand AFM force action mechanism and parameter setting.
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Description

technical field

[0001] The invention relates to an experimental instrument, more particularly, to an imaging system of an atomic force microscope based on a quartz tuning fork probe. Background technique

[0002] In 1986, Binnig and Quate invented the Atomic Force Microscope (AFM). The atomic force microscope uses a very thin needle tip to detect the sample surface point by point. When the distance between the needle tip and the sample surface reaches the nanometer level, the probe will be subjected to the interaction force generated by the sample. Morphological information. Through the combination with a variety of modern technologies, the atomic force microscope has not only become one of the microscopes with the highest resolution in the world, but also can perform nanoscale resolution imaging of samples in vacuum, atmosphere and liquid environments, and has nanomanipulation and assembly capabilities. , A powerful microscopic surface analysis instrument that can measure...

Claims

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