Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Imaging system of atomic force microscope on the basis of quartz tuning fork probe

An atomic force microscope and quartz tuning fork technology, applied in the field of experimental instruments, can solve the problems that it is difficult for students to quickly understand the working principle of the atomic force microscope, the high cost of the experiment, and the complicated operation of the instrument, so as to reduce the teaching cost, large scanning range and small size Effect

Inactive Publication Date: 2014-05-21
BEIHANG UNIV
View PDF9 Cites 14 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] Most of the existing experimental instruments of atomic force microscopes only have demonstrative experimental content, and the operation of commercial atomic force microscope instruments is relatively complicated and expensive
Students need to be trained for a long time to operate independently. It is difficult for students to quickly understand the working principle of the atomic force microscope, and the cost of the experiment is also high

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Imaging system of atomic force microscope on the basis of quartz tuning fork probe
  • Imaging system of atomic force microscope on the basis of quartz tuning fork probe
  • Imaging system of atomic force microscope on the basis of quartz tuning fork probe

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0046] The present invention will be further described in detail below in conjunction with the accompanying drawings.

[0047] The imaging system of the atomic force microscope based on the quartz tuning fork probe designed by the present invention is a teaching instrument designed to allow students to master the basic principles and applications of the atomic force microscope, improve the students' hands-on ability in experiments, and enhance the experimental effect. By actually operating the imaging system of the atomic force microscope based on the quartz tuning fork probe designed by the present invention, the students can scan and obtain the surface topography map of the sample 4A on the sample stage 4 . The atomic force microscope plays an important role in characterizing the surface structure and properties of substances, and it will be of great help to students in their future research and study through this experiment.

[0048] see figure 2 Shown, the present invent...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses an imaging system of an atomic force microscope (AFM) on the basis of a quartz tuning fork probe. An AFM controller in the system is respectively connected with a graphic display, a piezoelectric ceramic tube scanner, a drive circuit of a stepping motor, a feedback signal detection circuit and a scanning control signal processing circuit through wire cables so as to achieve transmission of electrical signals, a probe limiting seat is installed on a sample table, a round mounting table is mounted above the probe limiting seat, and the piezoelectric ceramic tube scanner, a displacement adjusting component and a circuit mounting box which is supported by four supporting columns are installed on the round mounting table. By means of the imaging system of the AFM on the basis of the quartz tuning fork probe, a student can know basic working principles of the AFM and operating steps of the imaging system, and the imaging system can be used for observing a microstructure of a sample. During an experiment, the student can measure force sensor--quartz tuning fork probe damping coefficient of the imaging system and observe bistable state phenomena to further understand AFM force action mechanism and parameter setting.

Description

technical field [0001] The invention relates to an experimental instrument, more particularly, to an imaging system of an atomic force microscope based on a quartz tuning fork probe. Background technique [0002] In 1986, Binnig and Quate invented the Atomic Force Microscope (AFM). The atomic force microscope uses a very thin needle tip to detect the sample surface point by point. When the distance between the needle tip and the sample surface reaches the nanometer level, the probe will be subjected to the interaction force generated by the sample. Morphological information. Through the combination with a variety of modern technologies, the atomic force microscope has not only become one of the microscopes with the highest resolution in the world, but also can perform nanoscale resolution imaging of samples in vacuum, atmosphere and liquid environments, and has nanomanipulation and assembly capabilities. , A powerful microscopic surface analysis instrument that can measure...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01Q60/24
Inventor 李英姿阳睿李进钱建强李华
Owner BEIHANG UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products